tag: aging

Aging Analysis Standard Solidifies Through Collaborative Effort
By Ahmed Ramadan - 12 Mar, 2020 - Comments: 0

By Ahmed Ramadan, Greg Curtis, Harrison Lee, Jongwook Kye, and Sorin Dobre We live in a connected world and it is estimated that by 20251 the total amount of worldwide data will swell to 163 ZB, or 163 trillion gigabytes. This rapid growth in data expansion is driving an explosion in new designs and new requirements for consumer, data center, automotive, and Internet of Things (IoT) applicat... » read more

Degradation Monitoring
By proteanTecs - 09 Mar, 2020 - Comments: 0

This paper describes a reliability degradation modeling and monitoring method based on a combination of IC novel embedded circuits (Agents), and off-chip machine learning algorithms which infer the digital readouts of these circuits during test and operational lifetime. Together, they monitor the margin degradation of an IC, as well as other vital parameters of the IC and its environmental s... » read more

Making Light More Reliable
By Ed Sperling - 11 Feb, 2020 - Comments: 0

The buzz around photonics in packages and between packages is growing. Now the question is whether it will work as expected, and where it will be useful. Replacing electrical with optical signals has been on the technology horizon for some time. Light moves faster through fiber than electrons through copper. How much faster depends upon the diameter of the wires, the substrate and interconne... » read more

Making 3D Structures And Packages More Reliable
By Ed Sperling - 14 Jan, 2020 - Comments: 0

The move to smaller vertical structures and complex packaging schemes is straining existing testing approaches, particularly in heterogeneous combinations on a single chip and in multi-die packages. The complexity of these devices has exploded with the slowdown in scaling, as chipmakers turn to architectural solutions and new transistor structures rather than just relying on shrinking featur... » read more

3 Safety Standards For Auto Electronics
By Ed Sperling - 13 Jan, 2020 - Comments: 0

Kurt Shuler, vice president of marketing at Arteris IP, drills down into the three main safety standards, ISO 26262, SOTIF (Safety of the Intended Function) and UL 4600, what each one covers, what the intent is behind them, and what this means for companies developing technology for future vehicles. » read more

Timing Is Of The Essence
By Ansys - 14 Mar, 2019 - Comments: 0

Today's advanced 16/7nm system-on-chips (SoCs) are faced with increased variation as they push for lower power. While the sizes of the transistors continue to shrink following Moore's Law, the threshold voltages fail to scale. This causes wide timing variability leading to timing closure difficulties, design re-spins and poor functional yield. Learn how ANSYS Path FX with its unique variatio... » read more

Taming NBTI To Improve Device Reliability
By Ann Mutschler - 08 Nov, 2018 - Comments: 2

Negative-bias temperature instability is a growing issue at the most advanced process nodes, but it also has proven extremely difficult to tame using conventional approaches. That finally may be starting to change. NBTI is an aging mechanism in field-effect transistors that leads to a change of the characteristic curves of a transistor during operation. The result can be a drift toward unint... » read more

Mission Profiles
By Jens Michael Warmuth - 13 Sep, 2018 - Comments: 1

In the field of electronic systems, the mission profile has been one of the key concepts since the start of the scientific examination of the subject of reliability. Its exact meaning varies with time and the industry using it. In particular, over the course of increasing digitalization and networking in the context of IoT and the opportunities resulting from this, the subject of mission profil... » read more

Minimizing Chip Aging Effects
By Brian Bailey - 13 Sep, 2018 - Comments: 2

Aging kills semiconductors, and it is a growing problem for an increasing number of semiconductor applications—especially as they migrate to more advanced nodes. Additional analysis and prevention methods are becoming necessary for safety critical applications. While some aspects of aging can be mitigated up front, others are tied to the operation of the device. What can an engineering tea... » read more

Cracking The Auto IC Market
By Ann Mutschler - 06 Sep, 2018 - Comments: 0

The market for automotive electronics is booming, and it has set off a global scramble among established chipmakers and startups. What's becoming clear, though, is that not everyone understands just how different automotive is from the mobile market. Mobile is still the highest-volume market for semiconductors, but the growth has flattened. In contrast, the value of the automotive electronic... » read more

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