tag: aging

Aging Analysis Common Model Interface Gains Momentum
By Greg Curtis - 25 Mar, 2021 - Comments: 0

By Greg Curtis, Ahmed Ramadan, Ninad Pimparkar, and Jung-Suk Goo In February 2019, Siemens EDA wrote an article1 entitled “The Time Is Now for a Common Model Interface”. Since that time, we have continued to see increasing demand for aging analysis, not only in the traditional automotive space, but also in other areas of technology design, such as mobile communication and IoT application... » read more

Power/Performance Bits: Dec. 23
By Jesse Allen - 23 Dec, 2020 - Comments: 0

Detecting early damage in power electronics Researchers at Osaka University to detect early damage in power electronics. The team used acoustic emission analysis to monitor in real time the propagation of cracks in a silicon carbide Schottsky diode during power cycling tests. During the power cycling test, the researchers mimicked repeatedly turning the device on and off, to monitor the res... » read more

Performance and Power Tradeoffs At 7/5nm
By Ed Sperling - 27 Oct, 2020 - Comments: 0

Semiconductor Engineering sat down to discuss power optimization with Oliver King, CTO at Moortec; João Geada, chief technologist at Ansys; Dino Toffolon, senior vice president of engineering at Synopsys; Bryan Bowyer, director of engineering at Mentor, a Siemens Business; Kiran Burli, senior director of marketing for Arm's Physical Design Group; Kam Kittrell, senior product management group d... » read more

The Quest To Make 5G Systems Reliable
By Ed Sperling - 13 Oct, 2020 - Comments: 0

Semiconductor Engineering sat down to discuss 5G reliability with Anthony Lord, director of RF product marketing at FormFactor; Noam Brousard, system vice president at proteanTecs; Andre van de Geijn, business development manager at yieldHUB; and David Hall, head of semiconductor marketing at National Instruments. What follows are excerpts of that conversation. SE: How do we measure the reli... » read more

Getting Particular About Partitioning
By Ed Sperling - 31 Aug, 2020 - Comments: 0

Partitioning could well be one of the most important and pervasive trends since the invention of computers. It has been around for almost as long, too. The idea dates back at least as far back as the Manhattan Project during World War II, when computations were wrapped within computations. It continued from there with what we know as time-sharing, which rather crudely partitioned access by p... » read more

Monitoring Chips After Manufacturing
By Brian Bailey - 19 Aug, 2020 - Comments: 2

New regulations and variability of advanced process nodes are forcing chip designers to insert additional capabilities in silicon to help with comprehension, debug, analytics, safety, security, and design optimization. The impact of this will be far-reaching as the industry discusses what capabilities can be shared between these divergent tasks, the amount of silicon area to dedicate to it, ... » read more

Spreading Out The Cost At 3nm
By Ed Sperling - 18 Jun, 2020 - Comments: 5

The current model for semiconductor scaling doesn't add up. While it's possible that markets will consolidate around a few basic designs, the likelihood is that no single SoC will sell in enough volume to compensate for the increased cost of design, equipment, mask sets and significantly more testing and inspection. In fact, even with slew of derivative chips, it may not be enough to tip the ec... » read more

Aging Problems At 5nm And Below
By Brian Bailey - 11 Jun, 2020 - Comments: 3

The mechanisms that cause aging in semiconductors have been known for a long time, but the concept did not concern most people because the expected lifetime of parts was far longer than their intended deployment in the field. In a short period of time, all of that has changed. As device geometries have become smaller, the issue has become more significant. At 5nm, it becomes an essential par... » read more

Monitoring For In-Die Process Speed Detection
By Richard McPartland - 14 May, 2020 - Comments: 0

Chip designers working on advanced nodes typically include a fabric of sensors spread across the die for a number of very specific reasons. In this, the second of a three-part blog series, we explore some of the key applications and benefits of these types of sensing solutions. In this installment, the focus is In-Die Process Speed Detection and why understanding in-chip process speed detecti... » read more

Last-Level Cache
By Ed Sperling - 06 Apr, 2020 - Comments: 0

Kurt Shuler, vice president of marketing at Arteris IP, explains how to reduce latency and improve performance with last-level cache in order to avoid sending large amounts of data to external memory, and how to ensure quality of service on a chip by taking into account contention for resources. » read more

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