The Double Whammy


By Ann Steffora Mutschler Given that at 40nm and below every [getkc id="81" kc_name="SoC"] has some mixed-signal content, combined with the fact that power awareness is top priority no matter what the target application is, design teams and verification engineers are grappling with tremendous challenges just to get a chip to yield. “For verification engineers and for designers, this is a ... » read more

Leveraging The Past


By Ann Steffora Mutschler It’s easy to forget that not every design today is targeted at 20nm, given the amount of focus put on the bleeding edge of technology. But in fact a large number of designs utilize the stability and reliability of older manufacturing nodes, as well as lower mask costs, by incorporating new design and verification techniques, with 2.5D designs being a prime example. ... » read more

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