Using AI In Semiconductor Inspection


AI is exceptionally good at spotting anomalies in semiconductor inspection. The challenge is training different models for different inspection tools and topographies, and knowing which model to use at any particular time. Different textures in backgrounds are difficult for traditional algorithms, for example. But once machine learning models are trained properly, they have proven effective in ... » read more

Ignoring Anomalies


Everyone has been in this situation at some point in their career—you have a data point that is so far out of the ordinary that you dismiss it as erroneous. You blame the test equipment, or the fact that it is Friday afternoon and happy hour started 10 minutes ago. In most cases it may never happen again and nobody will ever notice that you quietly swept it under the rug. But in doing so, ... » read more