tag: automatic test equipment

2017 ITC Wrap-up
By Jeff Dorsch - 06 Nov, 2017 - Comments: 0

Advantest was among the exhibitors and corporate sponsors at last week’s 2017 International Test Conference in Fort Worth, Texas. The automatic test equipment company also presented papers, took part in sessions, and provided posters during ITC’s technical program. In the booth, Advantest demonstrated its on-demand CloudTesting Service. It also showed off its EVA100 analog/mixed-signal IC t... » read more

Whither Xcerra?
By Jeff Dorsch - 11 Sep, 2017 - Comments: 0

Trade tensions between the People’s Republic of China and the Trump Administration could sink a big transaction in the automatic test equipment business. Xcerra, a supplier of semiconductor test systems, board testers, and electronic interconnects, announced in April that it had accepted an offer from Unic Capital Management, an affiliate of Sino IC Capital, to acquire the company for $10.... » read more

A Tale of Two Testers
By Jeff Dorsch - 07 Aug, 2017 - Comments: 0

David Tacelli, president and CEO of Xcerra, was excited. His company’s reception for customers (and the press) at the Trou Normand restaurant in San Francisco’s hip South of Market neighborhood was going very well. Gourmet salames and other tasty foods were on offer, along with fine wines and craft ales and beers. He gleefully pointed out to editors that the product to be introduced at t... » read more

Test at “West”
By Jeff Dorsch - 10 Jul, 2017 - Comments: 0

As you wander through the North Hall of Moscone Center this week, you may notice that some of the big names in automated test equipment are not on the SEMICON West show floor this year. Advantest America has a booth, but the same cannot be said of Teradyne or Xcerra. Some of the bigger names in test and measurement instruments won’t be found exhibiting at SEMICON West, either – such as Keys... » read more

A Brief History of Test
By Jeff Dorsch - 06 Mar, 2017 - Comments: 5

The history of semiconductor test systems is the subject of this blog post. We’ll turn to printed circuit board testing at another time. Boston-based Teradyne sold its D133 diode tester to Raytheon in 1961. Five years later, it introduced the J259 integrated circuit tester, which had a minicomputer to run the test programs. For many, this marks the beginning of automatic (or automated) tes... » read more

NAND ATE Market Gets Testy
By Mark LaPedus - 06 Feb, 2014 - Comments: 0

The NAND flash memory market is undergoing big changes. As planar NAND moves further down the 1xnm node regime, suppliers are ramping up devices with new cell structures, interfaces and other features. And on top of that, 3D NAND is beginning to appear in the market. The next-generation NAND devices will enable new applications in the mobile and enterprise markets, but the chips themselves p... » read more

Newer posts →

  • Sponsors

About

Navigation

Connect With Us

Copyright ©2013-2024 SMG   |  Terms of Service  |  Privacy Policy