2017 ITC Wrap-up

News from Advantest, Optimal+, Astronics Test Systems.

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Advantest was among the exhibitors and corporate sponsors at last week’s 2017 International Test Conference in Fort Worth, Texas. The automatic test equipment company also presented papers, took part in sessions, and provided posters during ITC’s technical program. In the booth, Advantest demonstrated its on-demand CloudTesting Service. It also showed off its EVA100 analog/mixed-signal IC test system, which now includes an integrated servo-loop function for faster test times and greater precision.

Optimal+, another ITC exhibitor and sponsor, had its chief technology officer, Michael Schuldenfrei, give a presentation on “Machine Learning as a Platform for the Future.”

At ITC, Astronics Test Systems expanded the capabilities of its ATS 5034 System-Level Test Platform. The semi-automatic ATS 5034 tester now has options for higher mix, lower volume, small lot, and longer test duration for semiconductor manufacturers. The system can be upgraded to fully automatic operation with a high-speed handler.

Aehr Test Systems showcased its next-generation FOX-XP multi-wafer test and burn-in system for high-volume production and early failure rate test. The company also exhibited its FOX-1P single-wafer platform for single-touchdown 300-millimeter full-wafer parallel test and its ABTS line of packaged-part burn-in and test systems.

Pickering Interfaces came to ITC with high-density PXI and Ethernet LXI switching and simulation offerings. The company also highlighted its eBIRST Switching System Test Tools and Switch Path Manager Signal Routing Software.

ITC TestWeek is a wrap for 2017!



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