Framework For Early Anomaly Detection In AMS Components Of Automotive SoCs

A technical paper titled “Enhancing Functional Safety in Automotive AMS Circuits through Unsupervised Machine Learning” was published by researchers at University of Texas at Dallas, Intel Corporation, NXP Semiconductors, and Texas Instruments. Abstract: "Given the widespread use of safety-critical applications in the automotive field, it is crucial to ensure the Functional Safety (FuSa) ... » read more