Designing And Testing FinFET-based IC Designs

By Carey Robertson and Steve Pateras The emergence of FinFET transistors has had a significant impact on the IC physical design and design-for-test flows. The introduction of FinFETs means that CMOS transistors must be modeled as three-dimensional (3D) devices during the IC design process, with all the complexity and uncertainty this entails. The BSIM Group of the UC Berkeley Device Group has ... » read more