tag: Cadence

Blog Review: May 15
By Jesse Allen - 15 May, 2024 - Comments: 0

Cadence's Anika Sunda suggests that RISC-V has opened numerous doors for innovation and believes EDA tools can help bridge the knowledge gap and foster a growing community of RISC-V developers. Synopsys' Alessandra Costa chats with industry experts about challenges facing analog design, what's needed for multi-die designs, and the potential of AI. Siemens' Bill Ji explains why understandi... » read more

Software-Defined Vehicle Momentum Grows
By Ann Mutschler - 09 May, 2024 - Comments: 0

Experts at the Table: The automotive ecosystem is undergoing a transformation toward software-defined vehicles, spurring new architectures with more software. Semiconductor Engineering sat down to discuss the impact of these changes with Suraj Gajendra, vice president of products and solutions in Arm's automotive line of business; Chuck Alpert, R&D automotive fellow at Cadence; Steve Spadon... » read more

UCIe And Automotive Electronics: Pioneering The Chiplet Revolution
By Vinod Khera - 09 May, 2024 - Comments: 0

The automotive industry stands at the brink of a profound transformation fueled by the relentless march of technological innovation. Gone are the days of the traditional, one-size-fits-all system-on-chip (SoC) design framework. Today, we are witnessing a paradigm shift towards a more modular approach that utilizes diverse chiplets, each optimized for specific functionalities. This evolution pro... » read more

Blog Review: May 8
By Jesse Allen - 08 May, 2024 - Comments: 0

Synopsys' Manuel Mota and Michael Posner look to UCIe as a complete stack for the die-to-die interconnect in multi-die chip designs, finding it can help maintain latency while reducing power and enhancing performance along with providing assurance of interoperability. Cadence's Durlov Khan highlights the Octal SPI interface for serial NAND flash, which enables 8-bit wide high bandwidth synch... » read more

CMOS Noise Margin Values
By Cadence - 08 May, 2024 - Comments: 0

One of the most important parameters describing digital systems operating at high speed is noise margin. In a general sense, noise margins define an acceptable level of noise that can be present on an I/O pin or in an interface. In terms of digital electronics, noise margin characterizes the level of noise that can appear on an I/O pin without creating an error in a received logic state. This i... » read more

Communication Is Key To Finding And Fixing Bugs In ICs
By Ann Mutschler and Adam Kovac - 08 May, 2024 - Comments: 0

Experts at the Table: Finding and eliminating bugs at the source can be painstaking work, but it also can prevent even greater problems from developing later on. To examine the best ways to tackle this problem, Semiconductor Engineering sat down with Ashish Darbari, CEO at Axiomise; Ziyad Hanna, corporate vice president R&D at Cadence; Jim Henson, ASIC verification software product manager ... » read more

Fundamental Issues In Computer Vision Still Unresolved
By Karen Heyman - 02 May, 2024 - Comments: 1

Given computer vision’s place as the cornerstone of an increasing number of applications from ADAS to medical diagnosis and robotics, it is critical that its weak points be mitigated, such as the ability to identify corner cases or if algorithms are trained on shallow datasets. While well-known bloopers are often the result of human decisions, there are also fundamental technical issues that ... » read more

Design Considerations In Photonics
By Karen Heyman - 01 May, 2024 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to talk about what CMOS and photonics engineers need to know to successfully collaborate, with James Pond, fellow at Ansys; Gilles Lamant, distinguished engineer at Cadence; and Mitch Heins, business development manager for photonic solutions at Synopsys. What follows are excerpts of that conversation. To view part one of this discussion,... » read more

Blog Review: May 1
By Jesse Allen - 01 May, 2024 - Comments: 0

Cadence's Vatsal Patel stresses the importance of having testing and training capabilities for high-bandwidth memory to prevent the entire SoC from becoming useless and points to key HBM DRAM test instructions through IEEE 1500. In a podcast, Siemens' Stephen V. Chavez chats with Anaya Vardya of American Standard Circuits about the growing significance of high density interconnect and Ultra ... » read more

Multi-Die Design Pushes Complexity To The Max
By Ann Mutschler - 29 Apr, 2024 - Comments: 1

Multi-die/multi-chiplet design has thrown a wrench into the ability to manage design complexity, driving up costs per transistor, straining market windows, and sending the entire chip industry scrambling for new tools and methodologies. For multiple decades, the entire semiconductor design ecosystem — from EDA and IP providers to foundries and equipment makers — has evolved with the assu... » read more

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