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Coverage-Directed Test Selection Method for Automatic Test Biasing During Simulation-Based Verification


New research paper titled "Supervised Learning for Coverage-Directed Test Selection in Simulation-Based Verification" from researchers at University of Bristol and Infineon Technologies. Abstract: "Constrained random test generation is one the most widely adopted methods for generating stimuli for simulation-based verification. Randomness leads to test diversity, but tests tend to repeate... » read more