More Efficient Side-Channel Analysis By Applying Two Deep Feature Loss Functions


A technical paper titled “Beyond the Last Layer: Deep Feature Loss Functions in Side-channel Analysis” was published by researchers at Nanyang Technological University, Radboud University, and Delft University of Technology. Abstract: "This paper provides a novel perspective on improving the efficiency of side-channel analysis by applying two deep feature loss functions: Soft Nearest Neig... » read more