Novel Molded FCBGA Package Platform For Highly Reliable Automotive Applications

By InRak Kim - 19 Sep, 2024 - Comments: 0

The conventional flip chip ball grid array (FCBGA) package platform has wide industry usage and provides high electrical performance. However, as high performance requirements increased, it encounters significant challenges. FCBGA packages frequently encounter underfill cracks after long term reliability or harsh reliability test conditions for automotive devices. Figure 1 shows the typical und... » read more

Next Gen Laser Assisted Bonding (LAB) Technology

By SeokHo Na - 18 May, 2023 - Comments: 0

In the semiconductor market, there are many applications including smartphone, tablets, central processing units (CPUs), artificial intelligence (AI), data cloud and more that are expecting rapid growth. Among them, CPU data processing, AI and data cloud require much higher power consumption than smart phones or tablets. For the higher power applications, Flip Chip ball grid array (FCBGA) or 2.... » read more

Evaluation of the Thermomechanical Reliability of Electronic Packages Using Virtual Prototyping

By Technical Paper Link - 18 Mar, 2023 - Comments: 0

A new technical paper titled "Design Optimization by Virtual Prototyping Using Numerical Simulation to Ensure Thermomechanical Reliability in the Assembly and Interconnection of Electronic Assemblies" was published by Fraunhofer ENAS. Abstract "A methodology is presented that allows the evaluation of the thermomechanical reliability of electronic packages using “virtual prototyping.” He... » read more

Challenges For Achieving Automotive Grade 1/0 Reliability In FCBGA and fcCSP Packages

By Knowlton Olmstead - 21 Apr, 2022 - Comments: 0

As the quantity, complexity, and functions of electronic devices in automobiles increase, understanding and characterizing package reliability is of significant concern and importance. The Automotive Electronics Council (AEC) Q-100 specification for Grade 1 and 0 reliability introduces unique challenges as thermal cycling (TC) and high temperature storage (HTS) requirements increase. Additional... » read more

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tag: flip chip ball grid array

Novel Molded FCBGA Package Platform For Highly Reliable Automotive Applications

Next Gen Laser Assisted Bonding (LAB) Technology

Evaluation of the Thermomechanical Reliability of Electronic Packages Using Virtual Prototyping

Challenges For Achieving Automotive Grade 1/0 Reliability In FCBGA and fcCSP Packages

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