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One Test Is Not Always Enough


To improve yield, quality, and cost, two separate test parameters can be combined to determine if a part passes or fails. The results gleaned from that approach are more accurate, allowing test and quality engineers to fail parts sooner, detect more test escapes, and ultimately to improve yield and reduce manufacturing costs. New data analytic platforms, combined with better utilization of s... » read more

Using Analytics To Reduce Burn-in


Silicon providers are using adaptive test flows to reduce burn-in costs, one of the many approaches aimed at stemming cost increases at advanced nodes and in advanced packages. No one likes it when their cell phone fails within the first month of ownership. But the problems are much more pressing when the key components in data warehouse servers or automobiles fail. Reliability expectations ... » read more