tag: in-circuit monitoring

The Growing Uncertainty Of Sign-Off At 7/5nm
By Ann Mutschler - 09 May, 2019 - Comments: 3

Having enough confidence in designs to sign off prior to manufacturing is becoming far more difficult at 7/5nm. It is taking longer due to increasing transistor density, thinner gate oxides, and many more power-related operations that can disrupt signal integrity and impact reliability.  For many years, designers have performed design rule checks as part of physical verification of the desi... » read more

How To Reduce Thermal Guard-Banding
By Ramsay Allen - 14 Feb, 2019 - Comments: 0

Accuracy in temperature sensors can have a big impact in designs from 40nm down to 7nm and beyond, reducing the amount of guard-banding that is required, which in turn can lower the power and extend the life and reliability of components. But at these process geometries, not all sensors measure temperature equally. Thermal guard-banding is a very important consideration for design teams, and... » read more

4 Issues In Test
By Ed Sperling - 10 Dec, 2018 - Comments: 0

When most design engineers think about test, they envision a large piece of equipment in the fab they probably will never actually see or interact with. But as chips become more complex—driven by an explosion in both quantity and different types of data—test is emerging as one of the big challenges in design and manufacturing. There are four primary segments for test, each with its own s... » read more

Ensuring Chip Reliability From The Inside
By Ann Mutschler - 31 May, 2018 - Comments: 0

Monitoring activity and traffic is emerging as an essential ingredient in complex, heterogeneous chips used in automotive, industrial, and data center applications. This is particularly true in safety-critical applications such as automotive, where much depends on the system operating exactly right at all times. To make autonomous and assisted driving possible, a mechanism to ensure systems ... » read more

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