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PGIREM: Reliability-Constrained IR Drop Minimization and Electromigration Assessment of VLSI Power Grid Networks using Cooperative Coevolution


Abstract "Due to the resistance of metal wires in power grid network, voltage drop noise occurs in the form of IR drop which may change the output logic of underlying circuits and may affect the reliability performance of a chip. Further, it is necessary to handle different reliability constraints while designing a robust power grid network for a chip. Any violation of such constraints may inc... » read more