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Automotive AI Hardware: A New Breed


Arteris IP functional safety manager Stefano Lorenzini recently presented “Automotive Systems-on-Chip (SoCs) with AI/ML and Functional Safety” at the Linley Processor Conference. A main point of the presentation was that conventional wisdom on AI hardware markets is binary. There’s AI in the cloud: Big, power-hungry, general-purpose. And there’s AI at the edge: Small, low power, limited... » read more

Three Steps To ISO 26262 Fault Campaign Closure


The complexity of automotive ICs continues to grow exponentially, challenging even the most veteran teams to deliver innovative products to market while simultaneously ensuring safety through the operational life of the product. This is the purpose of safety verification. Its primary objective is to understand whether the safety architecture sufficiently prevents random failures from violati... » read more

The Good And Bad Of Auto IC Updates


Keeping automobiles updated enough to avoid problems is becoming increasingly difficult as more complex electronics are added into vehicles, and as the lifetimes of those devices are extended to a decade or more. Modern vehicles are full of electronics. In fact, the value of electronic devices used in modern vehicles is expected to double in the next 10 years, growing to $469 billion by 2030... » read more

Orchestrating An Efficient ISO 26262 Fault Campaign


The primary objective of a fault campaign is to understand whether the safety architecture sufficiently prevents random failures from violating ISO 26262 safety requirements for both commercial and passenger automobiles. To complete fault injection, faults are injected and propagated in the design to validate the functional correctness of the safety mechanisms and to classify each fault. Fault ... » read more

Adding Value With Unit Level Traceability (ULT) In Automotive Packaging


Automotive product traceability has existed in one form or another for several decades. Traceability generally refers to tracking and tracing each component that comprises every subsystem in a car. Traditionally, this has been achieved with direct part marking on mechanical or electronic components, using 1D or 2D barcodes or radio-frequency identification (RFID). Since vehicle recalls are cost... » read more

Circuit Reliability Verification For Automotive Electronics


By Matthew Hogan and Dina Medhat In the automotive industry, reliability and high quality are key attributes for electronic automotive systems and controls. Naturally, they are particularly crucial when developing functional safety (FuSa) solutions, where inadequate performance or product failure can lead to injury or death. When it comes to safety-related automotive electronics, ISO 26262 p... » read more

Making Vehicle Electronics Safe With ISO 26262 Compliance


There are many semiconductor applications with high demands on safety, including spaceborne systems, nuclear power plants, and embedded medical devices. But automotive electronics are probably foremost in most peoples’ minds when they think about safe operation under all conditions. The advent of fully autonomous vehicles is responsible for much of this attention. Like other safety-critical a... » read more

Distributed Development Of IP And SoC In Compliance With Automotive ISO 26262


Automotive functional safety System-on-Chips (SoCs) for Advanced Driver Assistance Systems (ADAS) contain several complex Intellectual Property (IP) cores. The IP cores are developed as a Safety Element out of Context (SEooC), meaning the context of the end application is not fully known at delivery time. In addition, IP development might be distributed across the globe. To reduce the risk of f... » read more

Automotive Test Moves In-System


With the electrification of automobiles, it’s not enough to test the new electronics thoroughly at the end of the manufacturing process. Safety standards now require that tests be performed live, in the field, with contingency plans should a test fail. “We see clear demand from the automotive semiconductor supply chain for design functionality specifically aimed at in-system monitoring,... » read more

Tessent LogicBIST With Observation Scan Technology


Meeting the ISO 26262 requirements for high quality and long-term reliability mans implementing on-chip safety mechanisms with high defect coverage of IC logic. This paper describes Observation Scan Technology, a new new logic built-in-self-test (BIST) technology that improves logic BIST test quality and reduces in-system test time. Empirical results demonstrate 90% test coverage with up to 10X... » read more

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