Faster And Better Floorplanning With ML-Based Macro Placement


The chips contained in today’s consumer and commercial electronic products are staggering in size and complexity. The largest devices include central processing units (CPUs), graphics processing units (GPUs), and system-on-chip (SoC) devices that integrate many functions on a single die. Additionally, chips are expanding beyond their traditional borders with multi-die approaches such as 2.5DI... » read more

Ultimate Guide To Machine Learning For Embedded Systems


Machine learning is a subfield of artificial intelligence which gives computers an ability to learn from data in an iterative manner using different techniques. Our aim here being to learn and predict from data. This is a big diversion from other fields which poses the limitation of programming instructions instead of learning from them. Machine learning in embedded systems specifically target ... » read more

Cadence Cerebrus In SaaS And Imagination Technologies Case Study


Artificial Intelligence (AI) has made noteworthy progress and is now ready and available for electronic design automation. The Cadence Cerebrus Intelligent Chip Explorer utilizes AI—specifically, reinforcement machine learning (ML) technology—combined with the industry-leading Cadence digital full flow to deliver better power, performance, and area (PPA) more quickly. However, this highl... » read more

Transformer Model Based Clustering Methodology For Standard Cell Layout Automation (Nvidia)


A new technical paper titled "Novel Transformer Model Based Clustering Method for Standard Cell Design Automation" was published by researchers at Nvidia. Abstract "Standard cells are essential components of modern digital circuit designs. With process technologies advancing beyond 5nm, more routability issues have arisen due to the decreasing number of routing tracks (RTs), increasing numb... » read more

Embrace The New!


The ResNet family of machine learning algorithms was introduced to the AI world in 2015. A slew of variations was rapidly discovered that at the time pushed the accuracy of ResNets close to the 80% threshold (78.57% Top 1 accuracy for ResNet-152 on ImageNet). This state-of-the-art performance at the time, coupled with the rather simple operator structure that was readily amenable to hardware ac... » read more

A Hypermultiplexed Integrated Tensor Optical Processor (USC, MIT et al.)


A technical paper titled “Hypermultiplexed Integrated Tensor Optical Processor” was published by researchers at the University of Southern California, Massachusetts Institute of Technology (MIT), City University of Hong Kong, and NTT Research. Abstract: "The escalating data volume and complexity resulting from the rapid expansion of artificial intelligence (AI), internet of things (IoT) a... » read more

Thanks For The Memories!


“I want to maximize the MAC count in my AI/ML accelerator block because the TOPs rating is what sells, but I need to cut back on memory to save cost,” said no successful chip designer, ever. Emphasis on “successful” in the above quote. It’s not a purely hypothetical quotation. We’ve heard it many times. Chip architects — or their marketing teams — try to squeeze as much brag-... » read more

ML-Assisted IC Test Binning With Real-Time Prediction At The Edge


IC Test is a critical part of semiconductor manufacturing and proper die binning and material disposition has an important impact on the overall yield and on the process monitoring and failure mode diagnostics. Edge analytics are becoming an increasingly important aspect of die disposition. By intercepting parts in real-time at the wafer test step, we can save downstream processing needs. In th... » read more

Preparing For An AI-Driven Future In Chips


Experts at the Table: Semiconductor Engineering sat down to discuss the impact of AI on semiconductor architectures, tools, and security, with Michael Kurniawan, business strategy manager at Accenture; Kaushal Vora, senior director and head of business acceleration and ecosystem at Renesas Electronics; Paul Karazuba, vice president of marketing at Expedera; and Chowdary Yanamadala, technology s... » read more

Machine Learning Based MBIST Area Estimation


Majority of the silicon with-in a design is occupied by memories. Memories are more prone to failures than logic due to their density. Several techniques have been established to target and detect defects within these memory instances and their interfacing logic. The most widely used approach is memory built-in self-test (MBIST) that inserts on-chip hardware unit(s) which provides systematic me... » read more

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