tag: metrics

EDA Cloud Adoption Hits Speed Bumps
By Brian Bailey - 25 Oct, 2018 - Comments: 0

If moving semiconductor design to the Cloud was easy and beneficial, everyone would be doing it. But so far, few have done more than dip a toe. The level of difficulty associated with migrating to the Cloud varies, depending upon who you talk to. The reality is that not everyone makes it as easy as it could be, or is not willing to put the necessary effort into making it easier. There is cer... » read more

Is Cloud Computing Suitable for Chip Design?
By Brian Bailey - 27 Sep, 2018 - Comments: 2

Is semiconductor design being left behind in a cloud-dominated world? Finance, CRM, office applications and many other sectors have made the switch to a cloud-based computing environment, but the EDA industry and its users have hardly started the migration. Are EDA needs and concerns that different from everyone else? We are starting to see announcements from EDA companies, but few cheerleaders... » read more

Gaps In Verification Metrics
By Ann Mutschler - 23 Aug, 2018 - Comments: 0

As design complexity has exploded, the verification effort has likewise grown exponentially, with many different types of verification being applied to different classes of design. A recent panel discussion with leading chipmakers examined this topic in an effort to shed light on design health and quality, measuring the success of verification, knowing when verification is complete, being on... » read more

Get Ready For Verification 3.0
By Brian Bailey - 24 May, 2018 - Comments: 0

Jim Hogan, managing partner of Vista Ventures, LLC, is perhaps the best-known investor in the EDA space. Recently, he has been focusing time and attention on verification startups, including cloud technology company Metrics, and Portable Stimulus pioneer Breker Verification Systems. This adds to his longer-term commitment to formal verification with OneSpin Solutions. These companies are part ... » read more

EDA In The Cloud (Part 2)
By Brian Bailey - 02 May, 2018 - Comments: 0

Semiconductor Engineering sat down to discuss the migration of EDA tools into the Cloud with Arvind Vel, director of product management at ANSYS; Michal Siwinski, vice president of product management at Cadence; Richard Paw, product marketing manager at DellEMC, Gordon Allan, product manager at Mentor, a Siemens Business; Doug Letcher, president and CEO of Metrics, Tom Anderson, technical marke... » read more

EDA In The Cloud
By Brian Bailey - 26 Apr, 2018 - Comments: 4

Semiconductor Engineering sat down to discuss the migration of EDA tools into the Cloud with Arvind Vel, director of product management at ANSYS; Michal Siwinski, vice president of product management at Cadence; Richard Paw, product marketing manager at DellEMC, Gordon Allan, product manager at Mentor, a Siemens Business; Doug Letcher, president and CEO of Metrics, Tom Anderson, technical marke... » read more

RTL Done And Other Bogus Development Milestones
By Neil Johnson - 28 Mar, 2016 - Comments: 0

My definition of progress has changed over the years. I don’t think about it much anymore but it was obvious in a talk I gave a few weeks ago to a diverse group of hardware developers. Part of that talk centered around how we define progress in design and verification. This is a normal thing for me; I was speaking to slides I’d used several times before and the message was no different than... » read more

Gaps In Performance, Power Coverage
By Brian Bailey - 15 Oct, 2015 - Comments: 0

The semiconductor industry always has used metrics to define progress, and in areas such as functional verification significant advances have been made. But so far, no effective metrics have been developed for power, performance, or other system-level concerns, which basically means that design teams have to run blind. On the plus side, the industry has migrated from the use of code coverage... » read more

Full Coverage Or Full Monty?
By Brian Bailey - 09 Jun, 2015 - Comments: 0

Without adequate coverage metrics and tools, verification engineers would never be able to answer the proverbial question: are we done yet? But a lot has changed in the design flow since the existing set of metrics was defined. Does it still ensure that the right things get verified, that time is not wasted on things deemed unimportant or a duplication of effort, and can it handle today’s hie... » read more

Physical Lint: Physical Quality Metrics For Your RTL
By Mark Baker - 14 May, 2015 - Comments: 0

Why Analyze Physical Metrics at RTL? The quality of the logic structures generated from RTL has a direct impact on the number of design iterations required to close a design. Additionally, the quality of logic structures generated from RTL has a direct impact on design utilization. These trends are illustrated in Figure 1. Essentially, improving the quality of the logic structures in a d... » read more

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