Study Of Multi-Die And Multi-Technology Floorplanning (Texas A&M, Duke)


A new technical paper titled "PPAC Driven Multi-die and Multi-technology Floorplanning" was published by Texas A&M University and Duke University. Abstract "In heterogeneous integration, where different dies may utilize distinct technologies, floorplanning across multiple dies inherently requires simultaneous technology selection. This work presents the first systematic study of multi-die ... » read more

Multi-Die Health And Reliability: UCIe Advances


Although multi-die designs — an increasingly popular approach for integrating heterogeneous and homogenous dies into a single package — help resolve problems related to chip manufacturing and yield, they introduce a host of complexities and variables that must be addressed. In particular, designers must work diligently to ensure the health and reliability of their multi-die chip throughout ... » read more

Bold Prediction: 50% Of New HPC Chip Designs Will Be Multi-Die In 2025


Monolithic chips have been the workhorses behind decades of technological advancement. But just as the industrial revolution saw workhorses replaced with more efficient and powerful machinery, the semiconductor industry is on the cusp of a similar revolution. Multi-die and chiplet-based designs — which integrate multiple specialized dies in a single package or stack integrated circuits ver... » read more

Achieving Successful Multi-Die Signoff


Multi-die designs leveraging 2.5D and 3D technologies are becoming crucial for various electronics applications, including high-performance computing (HPC), artificial intelligence (AI), automotive, and mobile devices. These designs allow the integration of dies from different foundries and technology nodes, enhancing density and interconnect speeds beyond traditional discrete dies. However, th... » read more

Integrating Ethernet, PCIe, And UCIe For Enhanced Bandwidth And Scalability For AI/HPC Chips


By Madhumita Sanyal and Aparna Tarde Multi-die architectures are becoming a pivotal solution for boosting performance, scalability, and adaptability in contemporary data centers. By breaking down traditional monolithic designs into smaller, either heterogeneous or homogeneous dies (also known as chiplets), engineers can fine-tune each component for specific functions, resulting in notable im... » read more

Analysis Of Multi-Chiplet Package Designs And Requirements For Production Test Simplification


In recent years there has been a sharp rise of multi-die system designs. Numerous publications targeting a large variety of applications exist in the public domain. One presentation [2] on the IEEE’s website does a good job of detailing the anecdotal path of multi-die systems by way of chiplet building blocks integrated within a single package [2]. The presentation includes references to a ha... » read more

Innovate Faster with A Multi-Die Solution


The semiconductor industry is experiencing a monumental shift in chip design, driven by the dramatic increase in AI compute performance requirements and limitations of Moore’s Law. The industry is adopting multi-die designs, which is the heterogeneous or homogeneous integration of dies (also called chiplets) in a single package. While multi-die design is the solution, it also introduces se... » read more

3DIO IP For Multi-Die Integration


By Lakshmi Jain and Wei-Yu Ma The demand for high performance computing, next-gen servers, and AI accelerators is growing rapidly, increasing the need for faster data processing with expanding workloads. This rising complexity presents two significant challenges: manufacturability and cost. From a manufacturing standpoint, these processing engines are nearing the maximum size that lithogra... » read more

Advancements In Silicon Device Technology And Design Driving New SLM Monitor Categories


Silicon, the foundation of modern electronics, has seen continuous advancements since the early days of integrated circuits. The pace of innovation has been driven by the relentless quest for miniaturization, increased performance, and efficiency. However, Moore’s Law is no longer a given and silicon is facing functional limitations as technology scales. To address these challenges and conti... » read more

Simultaneous Bi-Directional Signaling: A Breakthrough Alternative For Multi-Die Assemblies


In designing multi-die systems-in-package, with or without chiplets, it is easy to think of the interconnect between dies as simply analogous to the interconnect between functional blocks on a single die. But this analogy can lead architects and designers into a blind alley from which it becomes impossible to meet system performance and power requirements. The reason lies in fundamental differe... » read more

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