Need For Speed Drives Targeted Testing


As packaging complexity increases and nodes shrink, defect detection becomes significantly more difficult. Engineers must contend with subtle variations introduced during fabrication and assembly without sacrificing throughput. New material stacks degrade signal-to-noise ratios, which makes metrology more difficult. At the same time, inspection systems face a more nuanced challenge — how t... » read more

Chip-Package-Board Issues Grow


As systems migrate from a single die in a single package on a board, to multiple dies with multiple packaging options and multiple PCB form factors, it is becoming critical to move system planning, assembly, and optimization much earlier in the design-through-manufacturing flow. This is easier said than done. Multiple tools and operating systems are now used at each phase of the flow, partic... » read more