System Bits: April 16


Characterizing 2D borophene Researchers at Rice and Northwestern universities collaborated on a method to view the polymorphs of 2D borophene crystals, providing insights into the lattice configurations of the two-dimensional material. Boris Yakobson, a materials physicist at Rice’s Brown School of Engineering, and materials scientist Mark Hersam of Northwestern led a team that not only d... » read more

System Bits: Feb. 11


Modeling computer vision on human vision University of Michigan scientists used digital foveation technology to render images that are more comprehensible to machine vision systems, while also reducing energy consumption by 80%. The effect is achieved by manipulating a camera’s firmware. “It'll make new things and things that were infeasible before, practical,” Professor Robert Dick s... » read more

Manufacturing Bits: Jan. 29


Thermal lithography Using a technique called thermal scanning probe lithography, New York University (NYU) and others have reported a breakthrough in fabricating 2D semiconductors. With the technology, researchers have devised metal electrodes with vanishing Schottky barriers on 2D semiconductors based on molybdenum disulfide (MoS₂). Thermal scanning probe lithography, sometimes called t-... » read more

Week in Review: IoT, Security, Auto


Internet of Things Automotive, health care, manufacturing, and the public sector could be transformed this year by Internet of Things technology, Bob Violino writes. Taqee Khaled, director of strategy at Nerdery, a digital business consultancy, predicts 2019 will see rapid evolution in enterprise IoT pilot initiatives and implementations. "This acceleration is due, in part, to advances in manu... » read more

A New Approach to Metrology


The startup Active Layer Parametrics Inc.'s ALPro 50 metrology tool offers “depth profiling of electrical properties at atomic-level resolution” —and automated processing with direct data transfer. The continuing miniaturization of microchips and nanochips has propelled the use of atomic-layer deposition and atomic-layer etch processes in semiconductor manufacturing. With miniaturization... » read more

Manufacturing Bits: Aug. 7


DNA ROMs The National Science Foundation (NSF) and the Semiconductor Research Corp. (SRC) are investing $12 million to develop a new class of memories and other technologies, such as DNA-based read-only memory (ROM), nucleic acid memory (NAM) and neural networks based on yeast cells. The effort is called the Semiconductor Synthetic Biology for Information Processing and Storage Technologies... » read more

The Week In Review: Manufacturing


R&D Late last month, the U.S. Congress finalized the federal spending for the remainder of the fiscal year. This includes R&D spending as well. “There was grave concern over the future of federal spending with the release of the president’s FY 2018 budget, which would have cut the National Science Foundation (NSF) budget by 11% and National Institutes of Standards & Technology (NIST) spend... » read more

Manufacturing Bits: April 10


Higher power GaN Imec and Qromis have announced the development of a new gallium nitride (GaN) substrate technology that enables power devices at 650 volts and above. GaN is an emerging technology for power semiconductor applications. Based on a GaN-on-silicon technology, GaN-based power semis operate at 650 volts and above. In simple terms, the buffer layers between the GaN device and the ... » read more

System Bits: April 10


Ultrafast laser beam steering for autonomous cars Researchers at Purdue University and Stanford University reported they have found a novel laser light sensing technology that is more robust and less expensive than currently available with a wide range of uses, including a way to guide fully autonomous vehicles. The team said this innovation is orders of magnitude faster than conventional l... » read more

System Bits: Nov. 14


Tracking cyber attacks According to Georgia Tech, assessing the extent and impact of network or computer system attacks has been largely a time-consuming manual process, until now since a new software system being developed by cybersecurity researchers here will largely automate that process, allowing investigators to quickly and accurately pinpoint how intruders entered the network, what data... » read more

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