Testing In Context Gaining Ground


Testing in context is beginning to gain wider appeal as chip complexity increases, and as ICs are deployed in more safety-critical and mission-critical applications. While design in context has been the norm for SoCs for some time, a similar approach in test has been slow going. Cell-aware testing technology was first described a decade ago, and since then its adoption has been modest. But w... » read more

Is It Safe To Assume That All “Passed” Die Are Actually “Good” Die?


In a world where Quality and Brand Protection is King, as certainly is the case for the automotive and medical device industries where strict minimal DPPM (defective parts per million) requirements are a common constraint, new methods for “escape” prevention and outlier detection are constantly being evaluated and implemented by semiconductor vendors to prevent any defective or marginal par... » read more

A More Efficient Way To Calculate Device Specs Of Thousands Of Tests For Improved Quality And Yield


Today’s devices are required to pass thousands of parametric tests prior to being shipped to customers. A key challenge test engineers face, in addition to optimizing the number of tests they run on the device, is how to quickly and accurately define the true specification limits that should be used to determine if the device is “good”. Device specification limits that are too wide may... » read more