Machine Learning Approach for Fast Electromigration Aware Aging Prediction in Incremental Design of Large Scale On-Chip Power Grid Network

Abstract "With the advancement of technology nodes, Electromigration (EM) signoff has become increasingly difficult, which requires a considerable amount of time for an incremental change in the power grid (PG) network design in a chip. The traditional Black’s empirical equation and Blech’s criterion are still used for EM assessment, which is a time-consuming process. In this article, for ... » read more