Too Much Fab And Test Data, Low Utilization


Can there be such a thing as too much data in the semiconductor and electronics manufacturing process? The answer is, it depends. An estimated 80% or more of the data collected across the semiconductor supply chain is never looked at, from design to manufacturing and out into the field. While this may be surprising, there are some good reasons: Engineers only look at data necessary to s... » read more

Why Data Format Slows Chip Manufacturing Progress


The Standard Test Data Format (STDF), a workhorse data format used to pull test results data from automated test equipment, is running out of steam after 35 years. It is unable to keep up with the explosive increase in data generated by more sensors in various semiconductor manufacturing processes. First developed in 1985 by Teradyne, STDF is a binary format that is translated into ASCII or ... » read more

New Data Format Boosts Test Analytics


Demand for more and better data for test is driving a major standards effort, paving the way for one of most significant changes in data formats in years. There is good reason for this shift. Data from device testing is becoming a critical element in test program decisions regarding limits and flows. This is true for everything from automotive and medical components to complex, heterogeneous... » read more