tag: semiconductor test

Making Sure AI/ML Works In Test Systems
By SE Staff - 09 Mar, 2021 - Comments: 0

Artificial intelligence/machine learning is being utilized increasingly to find patterns and outlier data in chip manufacturing and test, improving the overall yield and reliability of end devices. But there are too many variables and unknowns to reliably predict how a chip will behave in the field using just AI. Today, every AI use case — whether a self-driving car or an industrial sortin... » read more

Digital Test Bulks Up – Or Down
By Bryon Moyer - 08 Dec, 2020 - Comments: 2

Large digital integrated circuits are becoming harder to test in a time- and cost-efficient manner. AI chips, in particular, have tiled architectures that are putting pressure on older testing strategies due to the volume of test vectors required. In some cases, these chips are so large that they exceed reticle size, requiring them to be stitched together. New testing efficiencies are needed... » read more

Figuring Out Binary Datalog Formats Without A Specification
By yieldHUB - 08 Jun, 2020 - Comments: 0

Being in the realm of semiconductor data with a wide range of customers, companies often throw interesting technical challenges at us. The most complex one so far this year is probably a request (OK, a requirement!) to interpret binary test datalog files so that they can then be analysed from our yieldHUB database system. The company provided us with little information on the actual binary form... » read more

Using ML For Post-Silicon Validation
By Ed Sperling - 11 Jun, 2019 - Comments: 0

Ira Leventhal, vice president of Advantest’s new concept product initiative, talks about how to use machine learning to ferret out hidden relationships in a complex design and to utilize that data to improve chips. » read more

Week In Review: Manufacturing, Test
By Mark LaPedus - 07 Jun, 2019 - Comments: 0

Market research IC Insights has released its forecast for chips in terms of applications. Communications is still the biggest IC market, but automotive is growing the fastest. In its first forecast of artificial intelligence (AI) edge processors, International Data Corp. (IDC) estimates that worldwide shipments of AI-optimized processors for edge systems will reach 340.1 million units in 20... » read more

Challenges In Making And Testing STT-MRAM
By Mark LaPedus - 07 May, 2019 - Comments: 1

Several chipmakers are ramping up a next-generation memory type called STT-MRAM, but there are still an assortment of manufacturing and test challenges for current and future devices. STT-MRAM, or spin-transfer torque MRAM, is attractive and gaining steam because it combines the attributes of several conventional memory types in a single device. In the works for years, STT-MRAM features the ... » read more

Week In Review: Manufacturing, Test
By Mark LaPedus - 19 Apr, 2019 - Comments: 0

Chipmakers Here comes the battle between 5nm and 6nm processes at two foundry vendors—Samsung and TSMC. Meanwhile, Intel is behind and scrambling to get 10nm out the door. (Intel's 10nm is equivalent to 7nm from the foundries.) Last week, TSMC announced delivery of a complete version of its 5nm design infrastructure. TSMC’s 5nm technology is based on a finFET. This week, Samsung anno... » read more

Week In Review: Manufacturing, Test
By Mark LaPedus - 07 Dec, 2018 - Comments: 0

Fab tools/manufacturing Lam Research has accepted Martin Anstice’s resignation as chief executive and a member of the board. Lam has named Tim Archer as president and chief executive effective immediately. Archer, who served as Lam’s president and chief operating officer, has been named to the board. One analyst provided a comment on the situation at Lam. “In our view, Mr. Archer is very... » read more

Week In Review: Manufacturing, Test
By Mark LaPedus - 30 Nov, 2018 - Comments: 0

Chipmakers GlobalFoundries has announced that its advanced silicon-germanium (SiGe) offering is available for prototyping on 300mm wafers. GF’s SiGe technology has been shipping on its 200mm production line in Burlington, Vt. The technology, a 90nm SiGe process, is moving to 300mm wafers at GF’s Fab 10 facility in East Fishkill, N.Y. The SiGe technology is called 9HP. “The increasing ... » read more

NIWeek Test Talk
By Jeff Dorsch - 12 Jul, 2018 - Comments: 0

Semiconductor Engineering sat down with David Hall, Chief Marketer, Semiconductor, of National Instruments, and Mike Watts, NI’s Senior Solutions Marketer, Semiconductor Test, during NIWeek 2018 in Austin, Texas. “One of the opportunities for National Instruments is that over the last 10 years, we’ve seen larger semiconductor organizations change the way they do testing both for R&... » read more

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