A New Generation Of 7400 Socket


When I was 18, and just been accepted at Brunel University in West London to start my undergraduate degree in electrical and electronic engineering, I sent off a letter to Texas Instruments telling them about the journey ahead of me and asked if they could they send me a copy of their TTL Data Book. A few weeks later a package arrived and there it was. This incredible brown/orange book, thicker... » read more

Test Connections Clean Up With Real-Time Maintenance


Test facilities are beginning to implement real-time maintenance, rather than scheduled maintenance, to reduce manufacturing costs and boost product yield. Adaptive cleaning of probe needles and test sockets can extend equipment lifetimes and reduce yield excursions. The same is true for load board repair, which is moving toward predictive maintenance. But this change is much more complicate... » read more

Cleaning Up During IC Test


Test is a dirty business. It can contaminate a unit or wafer, or the test hardware, which in turn can cause problems in the field. While this has not gone unnoticed, particularly as costs rise due to increasing pin and ball density, and as more chips are bundled together in a package, the cost of dirt continues to be a focus. Cleaning recipes for test interface boards are changing, and analy... » read more