3D X-ray of chip interiors
Researchers from the Paul Scherrer Institute, EPFL Lausanne, ETH Zurich, and the University of Southern California used X-rays to take non-destructive, three-dimensional images of the inside of a microchip at 4 nanometer resolution.
To create the images, the researchers relied on a technique called ptychography, in which a computer combines many individual images ...
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