Test Data Streaming For The Next Generation Of Designs


Semiconductor chips have been evolving to meet the demands of rapidly transforming applications, and so has the test technology to meet the test goals of those chips. Going back two decades or so, the applications were limited and the designs were simpler, thus the concerns about power, performance and area (PPA), turn-around time, re-use and time-to-market, etc., were important but not as crit... » read more

High-Quality Test And Embedded Analytics Are Vital For Secure SoCs


Applications like as smart cards and devices used in the defense industry require security to ensure that sensitive data is inaccessible to outside agents. This used to be a niche requirement met through custom solutions. However, now that automotive and cyber-physical systems are proliferating, the requirements around secure test and monitoring are becoming mainstream. The current best strateg... » read more

Squeezing Out More Test Compression


The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been quite effective at containing test costs. For many designs, standard test compressions is enough, but ICs for use in automotive and medical devices require a higher manufacturing test quality, which t... » read more