tag: traces

Open-Short Normalization Method For A Quick Defect Identification In Branched Traces With High-Resolution Time-Domain Reflectometry
By Advantest - 07 Sep, 2022 - Comments: 0

Time-domain reflectometry (TDR) that employs electro-optical sampling affords excellent resolution at the femtosecond level and exhibits a comprehensible impulse waveform, thereby allowing quick defect identification in a single trace. However, it remains challenging to identify a defect in a trace of multiple branches; the TDR waveform is complex. Generally, the TDR waveform of a defective uni... » read more

Interconnect Challenges Grow, Tools Lag
By Brian Bailey - 15 Jun, 2020 - Comments: 2

Interconnects are becoming much more problematic as devices shrink and the amount of data being moved around a system continues to rise. This limitation has shown up several times in the past, and it's happening again today. But when the interconnect becomes an issue, it cannot be solved in the same way issues are solved for other aspects of a chip. Typically it results in disruption in how ... » read more

Correct-By-Design Methodology Requires Carefully Defined Constraints
By John McMillan - 14 May, 2015 - Comments: 0

Since the dawn of PCB usage, constraints have been an important part of the design. What are the dimensions? What weight of copper? Now, constraints have become much more than just physical dimensions. The most important constraints are defined by the design requirements of differential pairs, BGAs, low voltage devices, and high-speed parallel interfaces. The cost of rework skyrockets the fu... » read more

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