A Universal Deep Learning Model For Segmenting Automated Optical Inspection Images


A new technical paper titled "A Universal AI-Powered Segmentation Model for PCBA and Semiconductor" was published by researchers at Nordson Corporation. "This paper introduces a novel universal deep learning model designed to segment AOI images for both PCBA and 17 semiconductor components, offering a more robust and adaptable solution for defect detection," states the paper. Read more he... » read more