The Data Dilemma In Semiconductor Testing And Why It Matters: Part 2

In Part 1, we explored the challenges of implementing machine learning and real-time analytics in semiconductor testing—chiefly, the difficulty of transferring device test data across multiple locations and organizations. In this post, we introduce Data Feed Forward (DFF) as it applies to ACS Advantest.

What is ACS DFF?

ACS DFF is a cloud-enabled solution designed to simplify, secure, and automate the transfer of device test data between test floors—whether they’re located at fabs, OSATs, or product owner facilities. It works in tandem with Advantest’s Real-Time Data Infrastructure (RTDI), creating a seamless data pipeline from one insertion to the next.

By handling the technical, security and operational complexities of data exchange, DFF allows engineering teams to focus on what matters most—developing innovative test strategies and improving product outcomes. DFF allows the separation of test program, data and algorithms.

How it works

At its core, ACS DFF operates as a secure, rules-based data streaming engine:

• Collection: Device test data is captured at the source test cell using ACS RTDI and stored locally in the ACS Unified Server.
• Preparation: A rules engine filters, cleans, and formats the data—ensuring only what’s relevant is sent downstream. ACS DFF provides the ability to feed forward CUSTOM data based on a pre-defined schema.
• Transfer: Filtered data are securely streamed via the Advantest ACS Cloud.
• Delivery: Data is pre-fetched to the destination test floor’s Unified Server before test insertion, ready for immediate use in the destination test cell.

No manual cleanup. No last-minute IT coordination. Just automated, policy-compliant data delivery.

Why it’s a game-changer

ACS DFF offers clear advantages to semiconductor engineering teams:

• Automated transfer: No more engaging with fab or OSAT IT departments for every test cycle.
• Pre-filtered data: Engineers no longer have to manually clean or sort device test data.
• Timely delivery: Data is delivered exactly where and when it’s needed—before the next insertion even begins.

And with intuitive UI and CLI interfaces, engineers can define transfer rules, create filters, and access reports very easily.

The bottom line

ACS DFF unlocks the full potential of test data in modern semiconductor manufacturing. By ensuring that clean, usable data is available across insertions—without the typical operational drag—product owners can run smarter tests, reduce costs, and improve outcomes.

For organizations striving to harness machine learning and advanced analytics, DFF isn’t just a tool — it’s a foundational capability.