What happens when pseudo-random LBiST patterns are applied to complex designs in automotive and data centers?
Logic BIST (LBIST) is a well-stablished traditional solution for meeting automotive testing standards. However, using pseudo-random LBIST patterns can be challenging when trying to achieve high-quality testing due to the increased complexity of designs. The growing amount of electronic content, along with the shift toward fully autonomous vehicles, demands stringent testing requirements.
In-system deterministic test (IS-EDT) methods are necessary to address aggressive test-time constraints, design complexity and the need to update test content based on defect rates. These methods combine the generation and retargeting of deterministic test patterns. Tessent In-System Test, a solution from Siemens EDA, integrates IS-EDT with the Tessent Streaming Scan Network (SSN) to enable users to run deterministic patterns in-system. While the demand for IS-EDT patterns is especially critical in the automotive industry, this technology also benefits data center and networking designs.
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