tag: LBIST

DFT In Automotive
By Ed Sperling - 13 May, 2026 - Comments: 0

Ensuring automotive chips are reliable, defect-free, and secure adds a whole new dimension to design for testability (DFT). Depending on the safety criticality of a system in an automobile, tests can range from key-on, once a car is started, to safety-critical features that may need to be tested every couple hundred milliseconds during operation. Lee Harrison, director of automotive IC solution... » read more

Making The Most of Test Resources
By Laura Peters - 09 Sep, 2025 - Comments: 0

Semiconductor testing is undergoing multiple paradigm changes at once with the common goals of producing more known good die per month with low test cost. Achieving these goals requires a delicate balance between yield, quality, and test times. There are multiple ways to go about making better use of existing resources, many of which involve an increasing use of design for test (DFT) methods... » read more

Using High-Quality Deterministic Patterns For In-System/In-Field Testing
By Siemens EDA - 10 Jul, 2025 - Comments: 0

Logic BIST (LBIST) is a well-stablished traditional solution for meeting automotive testing standards. However, using pseudo-random LBIST patterns can be challenging when trying to achieve high-quality testing due to the increased complexity of designs. The growing amount of electronic content, along with the shift toward fully autonomous vehicles, demands stringent testing requirements. In-... » read more

In-System/In-Field Testing Using High-Quality Deterministic Test Patterns
By Ashrith Harith - 10 Jun, 2025 - Comments: 0

The amount of electronic content in passenger cars is growing rapidly, primarily due to the integration of advanced safety features. The shift towards fully autonomous vehicles, which must comply with stringent safety standards, will further increase the number of electronic components required. Testing efforts must be of exceptional quality. The target test time is often limited to less than 1... » read more

Automotive MCUs: Digital Twin of the LBIST Functionality
By Technical Paper Link - 15 Feb, 2023 - Comments: 0

A new technical paper titled "A Novel LBIST Signature Computation Method for Automotive Microcontrollers using a Digital Twin" was written by researchers at Infineon Technologies, University of Bremen, and DFKI GmbH. Abstract "LBIST has been proven to be an effective measure for reaching functional safety goals for automotive microcontrollers. Due to a large variety of recent innovative fea... » read more

Don’t Let X Be A Problem For Logic BIST
By Rahul Singhal - 12 Oct, 2021 - Comments: 0

By Rahul Singhal and Giri Podichetty A failure in the operation of integrated circuits (ICs) or chips deployed in safety-critical applications such as automotive, medical, and aerospace could have catastrophic consequences. These failures could stem from defects in the chip that escaped manufacturing tests or from transient faults that can occur during system operation due to factors such as... » read more

Preventing Chips From Burning Up During Test
By Bryon Moyer - 09 Mar, 2021 - Comments: 1

It’s become increasingly difficult to manage the heat generated during IC test. Absent the proper mitigations, it’s easy to generate so much heat that probe cards and chips literally can burn up. As a result, implementing temperature-management techniques is becoming a critical part of IC testing. “We talk about systems, saying the system is good,” said Arun Krishnamoorthy, senior... » read more

Automotive Test Moves In-System
By Bryon Moyer - 09 Feb, 2021 - Comments: 1

With the electrification of automobiles, it’s not enough to test the new electronics thoroughly at the end of the manufacturing process. Safety standards now require that tests be performed live, in the field, with contingency plans should a test fail. “We see clear demand from the automotive semiconductor supply chain for design functionality specifically aimed at in-system monitoring,�... » read more

How To Meet Functional Safety Requirements With Built-In-Self-Test
By Lee Harrison - 04 Jun, 2020 - Comments: 1

With the rapid growth in semiconductor content in today’s vehicles, IC designers need to improve their process of meeting functional safety requirements defined by the ISO 26262 standard. The ISO 26262 standard defines the levels of functional safety, known as Automotive Safety Integrity Level (ASIL), and is a mandatory part of an automotive system design process. The ASIL categories range... » read more

BiST Vs. In-Circuit Sensors
By SE Staff - 13 May, 2020 - Comments: 0

Monitoring the health of a chip post-manufacturing, including how it is aging and performing over time, is becoming much more important as ICs make their way into safety-critical applications such as the central brain in automobiles. Faced with longer lifespans and a growing body of functional safety rules, systems vendors need to be able to predict when a part will fail. But as sensing auto... » read more

← Older posts

  • Sponsors

About

Navigation

Connect With Us

Copyright ©2013-2026 SMG   |  Terms of Service  |  Privacy Policy