Blog Review: Dec. 7

Verification techniques in FPGA; automotive virtual prototyping; chiplets; CXL questions.


Siemens EDA’s Harry Foster looks at the continual maturing of FPGA functional verification processes through increasing adoption of various simulation-based and formal verification techniques.

Synopsys’ Stewart Williams introduces the Scalable Open Architecture for Embedded Edge (SOAFEE) project and how it can make automotive software development, testing, virtual prototyping, and validation more efficient and effective.

Cadence’s Paul McLellan listens in as R. ‘Suds’ Sudhakar of Cisco explores the economics of chiplets from a yield perspective and how the company has used them.

A Rambus writer dives into details of CXL technology, including the maximum number of nodes in memory pooling, support for chiplet implementations, end-to-end latency, and co-packaged optics.

Coventor’s Chris Welham checks out how temperature variations can change the Q-factor of a 3-axis MEMS gyroscope when encapsulated in a sealed cavity filled with an inert gas.

Ansys’ Jamie J. Gooch points to how 3D electromagnetic simulation and a physics-based modeling environment was used to help ensure seamless communications for the Artemis I moon mission throughout each stage.

Arm’s Tim Thornton provides an update on Arm’s effort to its production EDA environment to Arm-based cloud instances and compares the performance of several Cadence tools on AWS Graviton2 versus Graviton3.

SEMI’s Serena Brischetto chats with Claire HyunJung Seo of Samsung about how sustainability is shaping the semiconductor industry and more sustainable manufacturing practices.

And catch up on blogs featured in the latest Automotive, Security & Pervasive Computing and Test, Measurement & Analytics newsletters:

Synopsys’ Gulam Ashrafi questions why it’s so difficult to add security into automotive designs, and why it’s so important.

Arteris IP’s Michael Frank and Frank Schirrmeister dig into why using a NoC can greatly simplify the development of an SoC —  depending on who is developing the NoC.

Siemens EDA’s Jacob Wiltgen contends that the road to full autonomy requires connecting the virtual and physical with real-world feedback.

Cadence’s Ben Gu lays out how sensors, edge data centers, and control systems play critical roles in enabling Industry 4.0.

Cycuity’s Anders Nordstrom looks at striking the right balance between abstraction and verifiability.

Infineon’s Suresh Thangavel shows how SiC MOSFETs improve photovoltaic power systems.

Rambus’ Maxim Demchenko looks at utilizing Media Access Control Security for maximum speed and security.

Onto Innovation’s Mike McIntyre explains how to pinpoint common factors in otherwise isolated failures.

Siemens’ Peter Shields examines high-efficiency trace for RISC-V designs.

Synopsys’ Pawini Mahajan shows how to ensure a design is DFT-friendly.

Teradyne’s Eli Roth drives home the importance of malware-free fab equipment integration.

Advantest’s Zhenhua Chen explains why measuring the ATE PCB test fixture is a critical step that can save time later.

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