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Blog Review: March 10

Verification maturity and bug escapes; auto key fob hack; what drives innovation.

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Siemens EDA’s Harry Foster checks out how the maturity of verification processes impact bug escapes in FPGA designs and whether safety critical development processes prevent bugs from escaping to silicon.

Synopsys’ Dennis Kengo Oka examines the weaknesses and vulnerabilities in automotive keyless entry systems and how security researchers hacked the Tesla Model X key fob.

Cadence’s Paul McLellan explains the development of the Open Access layout database standard and recent updates to modernize it, including improved capacity, more constraints, and cloud-readiness.

Arm’s Vladimir Marchenko explores the Arm runtime system for Functional Safety, a safety-certified set of software components for embedded development, and how it enables process isolation to execute both critical and uncritical functionalities on a single microcontroller core.

In a video, VLSI Research’s G. Dan Hutcheson discusses how Moore’s Law and other similar laws create virtuous cycles in the semiconductor industry, the impact of lithography, and why global, interconnected collaboration is necessary for chip innovation.

In a blog for SEMI, Stuart Schaag of E-Ward Trade Consulting traces the rise of Vietnam’s electronics industry, which now accounts for about 40% of the country’s exports.

Ansys’ Peter Hallschmid, Federico Gomez, and Sébastien Noygues introduce a workflow to optimize the efficiency of the CMOS sensor in conjunction with the additional macroscopic lens and electronics subsystems of the camera.

Applied Materials’ Ortal Yesodi considers whether it’s time to rethink the current approaches to defect detection and management as chip complexity rises and inspection gets more expensive.

Nvidia’s Brian Caulfield highlights a startup using AI to analyze wastewater samples to detect potentially bacteria based on just a microscope photo.

And don’t miss the blogs featured in the latest Automotive, Security & Pervasive Computing and Test, Measurement & Analytics newsletters:

Editor in Chief Ed Sperling zeroes in on who wins and loses as more intelligence is added into devices.

Flex Logix’s Dana McCarty warns that proxies for actual workloads can only be so accurate.

Siemens EDA’s Lee Harrison shows why embedded root of trust and traceability are essential in a Defense In Depth strategy to mitigate security risks.

Xilinx’s Song Yao finds a framework to enable node-level FPGA virtualization with performance isolation, scalability, and flexibility for deep learning acceleration applications.

Cliosoft’s Srinath Anantharaman explains why it’s best to keep cloud deployment as easy and foolproof as possible.

OneSpin’s John Hallman contends that it’s no longer enough to have security protections in the software alone.

Synopsys’ Marc Serughetti details how to improve productivity during functional safety verification.

Rambus’ Denis Pochuev notes that the ability to communicate in secret is only as good as the ability to protect the keys.

Cadence’s Paul McLellan observes that autonomous driving systems are rapidly gaining proficiency, but still don’t scale in some areas.

Onto Innovation’s Kevin Heidrich explains why increasingly extreme 3D NAND aspect ratios pose new manufacturing challenges.

Synopsys’ Guy Cortez digs into how SiliconDash is getting meaningful and actionable insights from the vast amount of available manufacturing data.

Tortuga Logic’s Andreas Kuehlmann explains what the multi-layered pandemic response can teach about combatting cyberattacks.

Coventor’s Assawer Soussou explains how to use combined process and circuit modeling to estimate the performance of the next generation of semiconductors.



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