Aftermarket Sensors Boost Yield In Wafer Fabs
By Anne Meixner - 10 Dec, 2024 - Comments: 0

Third-party sensors are being added into fab equipment to help boost yield and to extend the life of expensive tools, supplementing the sensors that come with equipment used in fabs. The data gleaned from those sensors has broad uses within the fab. It can measure process module performance, identify defect sources, and alert fabs of impending equipment failure. And when coupled with machine... » read more

Silicon Lifecycle Management Gains Steam
By Laura Peters - 10 Dec, 2024 - Comments: 0

Silicon lifecycle management (SLM) is gaining significant traction, driven increasingly by stringent reliability requirements for safety-critical devices in aerospace, medical, and automotive. Improving reliability has been a discussion point for years, but it has become especially important with the use of chips designed at leading-edge nodes in both mission- and safety-critical application... » read more

AI Predictive Modeling Tools Move Into Critical Role To Leverage AI, ML
By John Kibarian - 10 Dec, 2024 - Comments: 0

The semiconductor industry, as always, is at the forefront of transformational technological innovation, driving escalating complexity of manufacturing processes that extend time-to-market delivery, inflate research and development costs, and lead to expensive delays when problems arise. As manufacturers navigate these challenges, the need for comprehensive prediction of manufacturing proble... » read more

ESD Verification For 2.5D And 3D-ICs
By Siemens EDA - 10 Dec, 2024 - Comments: 0

Ensuring your integrated circuit (IC) design can withstand electrostatic discharge (ESD) events without incurring damage or failure is an extremely important activity in IC circuit design and verification. While automated flows for ESD verification are well-established for regular 2D ICs, 2.5D and 3D integration presents new challenges in both ESD design and verification. The new automated ESD ... » read more

Gas Analysis For A Greener Tomorrow
By Antonia Eckert - 10 Dec, 2024 - Comments: 0

In our quest for a sustainable future, monitoring and managing air quality and greenhouse gases have become more critical than ever. Advanced technology plays a pivotal role in this endeavor. By providing the tools needed to understand and mitigate environmental impacts, we aim towards a greener tomorrow. The MGA Series from MIRO Analytical are laser-based gas analyzers designed for prec... » read more

Testing For Thermal Issues Becomes More Difficult
By Gregory Haley - 10 Dec, 2024 - Comments: 0

Increasingly complex and heterogeneous architectures, coupled with the adoption of high-performance materials, are making it much more difficult to identify and test for thermal issues in advanced packages. For a single SoC, compressing higher functionality into a smaller area concentrates the processing and makes thermal effects more predictable. But that processing can happen anywhere in a... » read more

Speeding Up Acoustic Wafer Inspection
By Ed Sperling - 09 Dec, 2024 - Comments: 0

Higher density and more vertical layers require higher-resolution inspection. In the past that generally resulted in longer scan times, which can slow throughput in the fab or assembly house. Bryan Schackmuth, senior product line manager at Nordson Test & Inspection, explains how rotational scanning using acoustic wafer inspection can speed up inspection time by a factor of eight, why it is... » read more

Efficient ESD Verification For 2.5/3D Automotive ICs
By Dina Medhat - 09 Dec, 2024 - Comments: 0

Protection against electrostatic discharge (ESD) events is an extremely important aspect of integrated circuit (IC) design and verification, particularly for 2.5/3D designs targeted for automotive systems. ESD events cause severe damage to ICs due to a sudden and unexpected flow of electrical current between two electrically charged objects. This current may be caused by contact, an electrical ... » read more

Auto Chip Aging Accelerates In Hot Climates
By Ed Sperling - 09 Dec, 2024 - Comments: 1

Automotive chips are aging significantly faster than expected in hot climates with sustained high temperatures, raising concerns about the reliability of electrified vehicles over time and whether advanced-node chips are the right choice for safety-critical applications. Many of the most advanced electronics used in vehicles today are ASIL D-compliant, expected to function up to 125° C. But... » read more

Redefining XPU Memory For AI Data Centers Through Custom HBM4: Part 2
By Archana Cheruliyil - 09 Dec, 2024 - Comments: 0

This is the second in a three-part series from Alphawave Semi on HBM4 and gives insights into HBM implementation challenges. Click here for part 1, for an overview on HBM, and in part 3, we will introduce details of a custom HBM implementation. Implementing a 2.5D System-in-Package (SiP) with High Bandwidth Memory (HBM) is a complex process that spans across architecture definition, designi... » read more

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