category: Next-Generation Test

category: IoT, Security & Automotive

Minimizing Execution Risk In Test Solution Development
By David Ducrocq - 12 Jul, 2022 - Comments: 0

Test development projects are a mix of engineering disciplines with a complex and interdependent ecosystem. The ability to assess risks and their impact on the entire project can be the difference between success and failure. A technical project lead provides a single point of responsibility for assessing technical risk across the project, developing mitigation plans, and driving countermeasure... » read more

Semiconductor Test: Staying Ahead Of Nanodevices
By Tucker Davis - 07 Jun, 2022 - Comments: 0

In the semiconductor fabrication process, engineers continue to innovate, enabling smaller transistors and higher density circuits. The transition to finFETs allowed 7nm and 5nm processes to realize circuits of amazing density, and the progress of nanosheet transistors provides confidence in the future advancement of digital circuit cost reduction and performance improvement. As individual t... » read more

Semiconductor Test In The Gate All Around Era
By Rick Burns - 10 May, 2022 - Comments: 0

The past two years have witnessed unprecedented growth in the semiconductor industry, driven by advances in artificial intelligence, natural language processing, automated vehicles, and augmented and virtual reality. All of these applications depend heavily on advancements in semiconductors to meet their needs for enormous computational processing and communication bandwidth to makes sense of t... » read more

Detecting Spatial Blotches In Image Sensor Devices
By Christos Pantelidis - 12 Apr, 2022 - Comments: 0

One of the most common defects in image sensor devices is spatial blotches. The appearance of blotches in image sensors is a regular occurrence and may be generated by internal moving parts or may be moved by air currents within the camera. Composed of two main statistical methods, the first module employs an inferential method, applying a spatial segmentation of the current frame to obtain ... » read more

Site-To-Site Variation In Parallel Test
By Ed Seng - 16 Mar, 2022 - Comments: 0

From wafer to system level test, parallel test execution delivers significant benefits, including reduced costs, yet it’s never as simple as that PowerPoint slide you present to management. An engineering effort is required to balance the thermo-electrical challenges that occur as you increase the number of sites to be tested, or the number of slots in a burn-in oven or system level te... » read more

Newer posts →

  • Sponsors

About

Navigation

Connect With Us

Copyright ©2013-2024 SMG   |  Terms of Service  |  Privacy Policy