category: Blogs – PTES

category: IoT, Security & Automotive

Coaxial Test Sockets Are In The Critical Path Of Advanced AI/CPU Products
By Jack Lewis - 08 May, 2025 - Comments: 0

Advanced AI/CPU processors demand extreme high frequency and power performance from SLT and ATE test sockets. These sockets are in the critical path at the end of a very costly silicon fabrication and advanced packaging manufacturing process. Yield loss at this point in the process is catastrophic to the bottom line. We at Modus Test, working in conjunction with our customers, have seen first-h... » read more

Chip Complexity Drives Innovation In Automated Test Equipment
By Jeorge Hurtarte - 08 May, 2025 - Comments: 0

Innovations in semiconductor technology—such as advancements in AI high-performance computing (HPC), Angstrom-scale silicon process nodes, silicon photonics, and automotive xEV wideband gap power transistor applications—require automated test equipment (ATE) to evolve at an unprecedented rate. As chip complexity grows, the challenges in design, manufacturing, and test multiply. It is a comp... » read more

Shift Left In DFT Design
By Jeff Mayer - 08 Apr, 2025 - Comments: 0

The semiconductor industry continues to face numerous challenges as designs approach reticle limits, process nodes evolve and engineering resources become increasingly stretched. It is essential to maintain high productivity and quality throughout the design flow. This keeps projects on schedule, within budget, and ensures they remain high-quality, reliable, yield well and perform as intended. ... » read more

Improving Manufacturing Yields With Process Control Solutions
By Jonathan Holt - 08 Apr, 2025 - Comments: 0

Even after 20 years or so, process control continues to be a confusing or misunderstood technology. A short description of process control is an accurate one—It’s a means of controlling manufacturing equipment and reducing variability to improve yields and performance of the products manufactured through that equipment. Tools like PDF Solutions Fault Detection and Classification (FDC)... » read more

Optimizing Tester Memory Resources With Pooling Technology
By Ronald Goerke - 08 Apr, 2025 - Comments: 0

The rapid evolution of semiconductor devices has amplified the demand for advanced automated test equipment (ATE) that can handle increasingly complex test scenarios for logic devices. ATE vector memory is becoming an increasingly valuable commodity as scan-pattern volume soars. Extrapolations based on data from the International Technology Roadmap for Semiconductors (ITRS) indicate that scan d... » read more

Accelerating Digital Transformation With Tight Integration Of Manufacturing Data
By Jonathan Holt - 17 Mar, 2025 - Comments: 0

Many semiconductor companies are involved in digital transformation of their overall processes and operations. Manufacturing is one of the most critical and value generating processes in a semiconductor company. Being able to tightly integrate manufacturing with the rest of the enterprise is a critical element of a successful digital transformation program. Recognizing the value of real-time... » read more

Measuring Multi-Layer Ultra-Thin Critical Films
By Jiangtao Hu - 11 Mar, 2025 - Comments: 0

Artificial intelligence is one of the driving forces in today’s semiconductor industry, with more traditional market drivers like high performance compute and smart phones continuing to play important roles. This situation is unlikely change in the years ahead as chip makers continue their quest to create the most advanced nodes. With 3nm nodes in production and 2nm nodes on the horizon, the ... » read more

Speeding Down Memory Lane With Custom HBM
By Faisal Goriawalla - 11 Mar, 2025 - Comments: 0

With the goal of increasing system performance per watt, the semiconductor industry is always seeking innovative solutions that go beyond the usual approaches of increasing memory capacity and data rates. Over the last decade, the High Bandwidth Memory (HBM) protocol has proven to be a popular choice for data center and high-performance computing (HPC) applications. Even more benefit can be rea... » read more

Unlocking The Value Of Yield
By Marc Hutner - 11 Mar, 2025 - Comments: 0

Have you stopped to consider the impact of yield on your overall product cost? Of course you did, when you considered your yield targets and set your product goals. But is it good enough to stop once the goals are achieved, or should you find ways to drive additional value into your organization once production has begun? What is the value of a 1% improvement in product yield? The short answer ... » read more

Silicon Photonics Raises New Test Challenges
By Jeorge Hurtarte - 11 Mar, 2025 - Comments: 0

Semiconductor devices continuously experience advancements leading to technology and innovation leaps, such as we see today for applications in AI high-performance computing for data centers, edge AI devices, electric vehicles, autonomous driving, mobile phones, and others. Recent technology innovations include Angstrom-scale semiconductor processing nodes, high-bandwidth memory, advanced 2.5D/... » read more

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