category: Blogs – PTES

category: IoT, Security & Automotive

Micro Dispensing: From Semiconductors To Sushi
By Muge Deniz Meiller - 11 Jun, 2024 - Comments: 0

The phrase “micro fluid dispensing” is generally associated with applications like medical device assembly or battery manufacturing. It certainly doesn’t conjure up visions of sushi – at least not yet. If engineers at IHI Aerospace and Yamagata University have their way, though, 3D printed sushi will be served to space tourists as they circle in low Earth orbit. Yes, printed sush... » read more

Using Predictive Data Analytics In Manufacturing
By Dieter Rathei - 11 Jun, 2024 - Comments: 0

Data is said to be the gold of the 21st century, but is that true? Even with trillions of lines of data in your database, you won’t be mining any gold – unless you understand what the data means. Here’s what’s happening all around the semiconductor industry: we have far too much data. The problem is that the value you need is hidden in the data, and to mine the gold from it, you need to... » read more

The Future Of Data Analytics And Semiconductor Testing
By Michael Chang - 11 Jun, 2024 - Comments: 0

The world is changing more rapidly than ever. With the explosion of Artificial Intelligence (AI), Machine Learning (ML) and data analytics, semiconductor manufacturers now have the opportunity to extract valuable insights from the massive amounts of data being generated throughout the silicon lifecycle. By leveraging AI algorithms and ML, semiconductor manufacturers can now optimize silicon des... » read more

The Importance Of Secure Data Sharing
By Mike McIntyre - 14 May, 2024 - Comments: 0

When it comes to data accessibility, the terms “secure” and “share” seem like two diametrically opposed words. Conventional wisdom would suggest that any effort to secure data would involve limiting access to that data, while sharing data would involve opening up access to that data for others to view and use. As it turns out, semiconductor operations need to do both. On the one h... » read more

Supporting Multiple Time Domains In SoC Production Test
By Hari Mani - 14 May, 2024 - Comments: 0

Complex system-on-chip (SoC) devices make every stage of the development flow harder, and the challenges continue even after the silicon is fabricated. Automatic test equipment (ATE) screening for defective wafers and assembled chips is always challenging. Production test engineers constantly struggle to minimize expensive test pattern memory, test each wafer or chip as quickly as possible, and... » read more

Advancing Product Performance Through Adaptable Production Test Equipment
By Michael Bryner - 14 May, 2024 - Comments: 0

Semiconductors are the backbone of modern electronics, powering everything from smartphones and laptops to autonomous vehicles and advanced medical equipment. As the semiconductor industry continues to push technological boundaries to deliver faster, smaller, and more powerful devices, ensuring the reliability and optimal performance of these components becomes increasingly challenging. A modu... » read more

Battery Management Testing: Alleviating EV Buyer Anxiety
By Thomas Koehler - 14 May, 2024 - Comments: 0

As the electric vehicle (EV) market surges towards 2040, fueled by strong consumer enthusiasm, the need to address key concerns about EV range, reliability, and battery life has become critical. Anxiety over potential range limitations, amplified by fears of scarce charging options, alongside safety worries due to media-reported battery incidents, have slowed adoption rates. Here, the semicondu... » read more

The Crucial Role Of High-Performance Computing In 2024: Balancing Cost And Innovation
By Keith Schaub - 14 May, 2024 - Comments: 0

We live in a world where digital queries run the Information Superhighway and in turn, our lives. This means that the importance of High-Performance Computing (HPC) cannot be overstated. The technology behind this continues to be a cornerstone for advancing our world and improving productivity. To put it another way, can you imagine a day, a week, when you are not querying something? So, let... » read more

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects
By Bryce Chi - 09 Apr, 2024 - Comments: 0

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control. Traditionally, AOI generates millions of defect images, all of which are manually reviewed by operators. This process is not only time-consuming but error prone due to human involvement and fatigue, whi... » read more

Reimagining PVT Monitoring IP For Advanced Node GAA Process
By Rohan Bhatnagar - 09 Apr, 2024 - Comments: 0

As process technology continues to evolve, so must design tools and the IP that support them. One example of an industry evolution is on the PVT monitoring IP side. The process, voltage, and temperature (PVT) monitors embedded within chips provide feedback on silicon status at every stage of the lifecycle, including mission use in the field. The data gathered from the monitors enables benefits ... » read more

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