category: Packaging

category: IoT, Security & Automotive

Study Of Multi-Die And Multi-Technology Floorplanning (Texas A&M, Duke)
By Technical Paper Link - 05 Apr, 2025 - Comments: 0

A new technical paper titled "PPAC Driven Multi-die and Multi-technology Floorplanning" was published by Texas A&M University and Duke University. Abstract "In heterogeneous integration, where different dies may utilize distinct technologies, floorplanning across multiple dies inherently requires simultaneous technology selection. This work presents the first systematic study of multi-die ... » read more

Evaluation Tool For The Cost Impacts Of Chiplet-Specific Design Choices
By Technical Paper Link - 25 Mar, 2025 - Comments: 0

A new technical paper titled "CATCH: a Cost Analysis Tool for Co-optimization of chiplet-based Heterogeneous systems" was published by researchers at UCLA, Duke University and Arizona State University. Abstract "With the increasing prevalence of chiplet systems in high-performance computing applications, the number of design options has increased dramatically. Instead of chips defaulting to... » read more

Defect Analysis and Testing Framework For FOWLP Interconnects
By Technical Paper Link - 24 Mar, 2025 - Comments: 0

A new technical paper titled "Defect Analysis and Built-In-Self-Test for Chiplet Interconnects in Fan-out Wafer-Level Packaging" was published by researchers at Arizona State University. Abstract "Fan-out wafer-level packaging (FOWLP) addresses the demand for higher interconnect densities by offering reduced form factor, improved signal integrity, and enhanced performance. However, FOWLP fa... » read more

EFO Errors In The Wire-Bonding Semiconductor Packaging Process
By Technical Paper Link - 19 Mar, 2025 - Comments: 0

A new technical paper titled "A Comparative Study on Various Au Wire Rinse Compositions and Their Effects on the Electronic Flame-Off Errors of Wire-Bonding Semiconductor Package" was published by researchers at Hanbat National University, Seoul National University and Chungnam National University. The paper states: "In this study, we identify the origin of electronic flame-off (EFO) erro... » read more

Multi-Party Computation for Securing Chiplets
By Technical Paper Link - 12 Mar, 2025 - Comments: 0

A new technical paper titled "Garblet: Multi-party Computation for Protecting Chiplet-based Systems" was published by Worcester Polytechnic Institute. Abstract "The introduction of shared computation architectures assembled from heterogeneous chiplets introduces new security threats. Due to the shared logical and physical resources, an untrusted chiplet can act maliciously to surreptitiousl... » read more

A Novel Tier Partitioning Method in 3DIC Placement Optimizing PPA
By Technical Paper Link - 11 Mar, 2025 - Comments: 0

A new technical paper titled "PPA-Aware Tier Partitioning for 3D IC Placement with ILP Formulation" was published by researchers at Seoul National University and Ulsan National Institute of Science and Technology. Abstract "3D ICs are renowned for their potential to enable high-performance and low-power designs by utilizing denser and shorter inter-tier connections. In the physical design f... » read more

Thermal-Aware DSE Framework for 3DICs, With Advanced Cooling Models
By Technical Paper Link - 11 Mar, 2025 - Comments: 0

A new technical paper titled "Cool-3D: An End-to-End Thermal-Aware Framework for Early-Phase Design Space Exploration of Microfluidic-Cooled 3DICs" was published by researchers at University of Michigan, Shanghai Jiao Tong University and University of Virginia. Abstract "The rapid advancement of three-dimensional integrated circuits (3DICs) has heightened the need for early-phase design spa... » read more

Thermally Aware Chiplet Placement Algorithm Based on Automatic Differentiation (MIT, IBM)
By Technical Paper Link - 07 Mar, 2025 - Comments: 0

A new technical paper titled "DiffChip: Thermally Aware Chip Placement with Automatic Differentiation" was published by researchers at MIT and IBM. Abstract "Chiplets are modular integrated circuits that can be combined to form a larger system, offering flexibility and performance enhancements. However, their dense packing often leads to significant thermal management challenges, requiring ... » read more

3D Stacked Device Architecture Enabled By BEOL-Compatible Transistors (Stanford et al.)
By Technical Paper Link - 26 Feb, 2025 - Comments: 0

A new technical paper titled "Omni 3D: BEOL-Compatible 3-D Logic With Omnipresent Power, Signal, and Clock" was published by researchers at Stanford University, Intel Corporation and Carnegie Mellon University. Abstract "This article presents Omni 3D—a 3-D-stacked device architecture that is naturally enabled by back-end-of-line (BEOL)-compatible transistors. Omni 3D interleaves metal lay... » read more

FOWLP Warpage: Review Of Causes, Modeling And Methodologies For Controlling
By Technical Paper Link - 14 Feb, 2025 - Comments: 0

A new technical paper titled "Warpage in wafer-level packaging: a review of causes, modelling, and mitigation strategies" was published by researchers at Arizona State University. Abstract "Wafer-level packaging (WLP) is a pivotal semiconductor packaging technology that enables heterogeneously integrated advanced semiconductor packages with high-density electrical interconnections through i... » read more

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