category: Top Stories

category: IoT, Security & Automotive

Test In New Frontiers: Flexible Circuits
By Susan Rambo - 12 Nov, 2019 - Comments: 0

Test is becoming increasingly complicated as new technologies such as flexible electronics begin playing mission-critical roles in applications where electronics have little or no history. Although flexible circuitry has been around for while, testing needs to catch up as these circuits are deployed across a variety of markets where conditions may be extreme. In many cases, sensors for monit... » read more

Leveraging Data In Chipmaking
By Ed Sperling - 12 Nov, 2019 - Comments: 0

John Kibarian, president and CEO of PDF Solutions, sat down with Semiconductor Engineering to talk about the impact of data analytics on everything from yield and reliability to the inner structure of organizations, how the cloud and edge will work together, and where the big threats are in the future. SE: When did you recognize that data would be so critical to hardware design and manufact... » read more

Reducing Costly Flaws In Heterogeneous Designs
By Ed Sperling - 08 Oct, 2019 - Comments: 0

The cost of defects is rising as chipmakers begin adding multiple chips into a package, or multiple processor cores and memories on the same die. Put simply, one bad wire can spoil an entire system. Two main issues need to be solved to reduce the number of defects. The first is identifying the actual defect, which becomes more difficult as chips grow larger and more complex, and whenever chi... » read more

Shrinking AV’s 1 Billion Test Miles
By Kevin Fogarty - 08 Oct, 2019 - Comments: 0

There is still no answer to how many miles an autonomous vehicle needs to drive before it's proven safe. But some AV developers and test companies are hoping to ease the burden a bit with automation that makes millions of real and simulated miles of road testing simpler to implement, supported by standards that make it easier to create and trade simulation scenarios. The goal is to reduce th... » read more

Testing Against Changing Standards In Automotive
By Ed Sperling and Kevin Fogarty - 08 Oct, 2019 - Comments: 0

The infusion of more semiconductor content into cars is raising the bar on reliability and changing the way chips are designed, verified and tested, but it also is raising a lot of questions about whether companies are on the right track at any point in time. Concerns about liability are rampant with autonomous and assisted driving, so standards are being rolled out well in advance of the te... » read more

How Hardware Can Bias AI Data
By Ed Sperling - 10 Sep, 2019 - Comments: 1

Clean data is essential to good results in AI and machine learning, but data can become biased and less accurate at multiple stages in its lifetime—from moment it is generated all the way through to when it is processed—and it can happen in ways that are not always obvious and often difficult to discern. Blatant data corruption produces erroneous results that are relatively easy to ident... » read more

Test On New Technology’s Frontiers
By Ed Sperling And Susan Rambo - 10 Sep, 2019 - Comments: 2

Semiconductor testing is getting more complicated, more time-consuming, and increasingly it requires new approaches that have not been fully proven because the technologies they are addressing are so new. Several significant shifts are underway that make achieving full test coverage much more difficult and confidence in the outcome less certain. Among them: Devices are more connected an... » read more

Nvidia’s Top Technologists Discuss The Future Of GPUs
By Ed Sperling And Susan Rambo - 10 Sep, 2019 - Comments: 0

Semiconductor Engineering sat down to discuss the role of the GPU in artificial intelligence, autonomous and assisted driving, advanced packaging and heterogeneous architectures with Bill Dally, Nvidia’s chief scientist, and Jonah Alben, senior vice president of Nvidia’s GPU engineering, at IEEE’s Hot Chips 2019 conference. What follows are excerpts of that conversation. SE: There are ... » read more

More Semiconductor Data Moving To Cloud
By Ed Sperling - 06 Aug, 2019 - Comments: 0

The cloud is booming. After years of steady growth it has begun to spike, creating new options for design, test, analytics and AI, all of which have an impact on every segment of the semiconductor industry. The initial idea behind the cloud is that it would supplement processing done on premises, adding extra processing power wherever necessary, such as in the verification and debug stages o... » read more

How Many Test Miles Make A Vehicle Safe?
By Kevin Fogarty - 06 Aug, 2019 - Comments: 0

The road to reliable safety testing of autonomous vehicles (AVs) is shifting left. Standards groups are beginning to publish functional safety standards that could make it possible to verify what a machine-learning AV pilot application will do in a traffic situation even before hardware or software is released from validation testing. This kind of approach has been possible for some time in ... » read more

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