category: Unlisted Blogs

category: IoT, Security & Automotive

Setting Up RISC-V Implementation Verification
By Shubhodeep Roy Choudhury - 26 Mar, 2020 - Comments: 0

This blog provides an overview of STING’s release mode of operation. STING design verification tool is released to the end user in the form of a self extracting script. The script can be used to install the release package in user’s environment. Once the package is installed, the user needs to set few environment variables before the STING executable can be built. The release package ... » read more

Auto Outlook: Down But Not Out
By Mark LaPedus - 19 Mar, 2020 - Comments: 0

For years, automotive has been an engine of growth in the semiconductor industry, although the market is expected to decline in 2020. Several types of chips are used in automobiles, such as analog, memory, microcontrollers, processors and RF. But the automotive IC business still represents a small percentage of the overall semiconductor market. It pales in comparison to the smartphone chip m... » read more

Big Problems In A Little Data World
By Keren Kanarik - 19 Mar, 2020 - Comments: 0

Lam Executive Vice President and Chief Technology Officer, Richard A. Gottscho, gave a keynote at the SEMI Industry Strategy Symposium (ISS), the annual executive conference for the semiconductor industry. Titled “I’m Living in a Little Data World, but I Have a Big Problem,” Rick talked about the challenges faced by the “little data world” of process development and the potential for ... » read more

Avoiding Gloom With Better Knowledge
By Stephen Crosher - 12 Mar, 2020 - Comments: 0

The rate of product development is facing very real challenges as the pace of silicon technology evolution begins to slow. Today, we are squeezing the most out of transistor physics, which is essentially derived from 60-year-old CMOS technology. To maintain the pace of Moore’s law, it is predicted that in 2030 we will need transistors to be a sixth of their current size. Reducing transistor s... » read more

Choosing The Right Level Of Programmability
By Tommy Mullane - 12 Mar, 2020 - Comments: 0

Designers prefer to design in flexibility. The reasons are legion and mostly obvious: you may not know today how a chip will be used tomorrow – best to delay setting anything in concrete until you are sure how it is going to be used. You may not fully understand the design until it is nearing completion, and premature optimization can leave you in a difficult situation. And there are more pra... » read more

MRAM Process Development And Production Briefing
By Jeff Barnum - 10 Mar, 2020 - Comments: 0

By Dr. Meng Zhu, Dr. Roman Sappey, and Jeff Barnum MRAM (Magnetoresistive Random-Access Memory) is a type of non-volatile memory (NVM) that utilizes magnetic states to store information. The basic structure of MRAM is a magnetic-tunnel junction (MTJ), which consists of two ferromagnetic (FM) layers separated by an insulating tunnel barrier (Fig.1). When the magnetizations of the two magnetic... » read more

What’s WAT? Testing At The End Of Manufacturing
By Marie Ryan - 10 Mar, 2020 - Comments: 0

The high costs of building, resourcing and operating a foundry fabricating integrated circuits are well known. Fabless companies avoid this capital cost and focus on design and innovation in their area of expertise. On the other hand, the fabless company relies on the expertise and skills of the foundry to produce quality wafers. Many times a process used by a fabless company to manufacture... » read more

Manufacturing Optimization With Digital Thread
By Michael Schuldenfrei - 10 Mar, 2020 - Comments: 0

Data is everywhere, and if you know what to do with it, can be tremendously valuable. Huge volumes of data are collected in manufacturing industries across the supply chain, with the help of technologies such as IoT platforms, sensors, and edge devices. However, data is only as good as the value extracted from it, and getting the most out of data is challenging. Because information is often con... » read more

Wafer Test Challenges For Chiplets
By Amy Leong - 10 Mar, 2020 - Comments: 0

In a heterogeneous integrated system, the impact of composite yield fallout due to a single chiplet is creating new performance imperatives for wafer test in terms of test complexity and coverage. From a test perspective, making chiplets a mainstream technology depends on ensuring Good Enough Die at a reasonable test cost. Wafer-level test plays a critical and intricate role in the chipl... » read more

A Tipping Point For Women In Semiconductors
By SE Staff - 09 Mar, 2020 - Comments: 0

Yesterday was International Women’s Day, which for some people was a day of protest and action to raise awareness of issues that women face around the world. The day was more than just a feel-good Google doodle that blipped across our screens on Sunday: women were out in the streets getting arrested, tear gassed, and sprayed with water hoses. In some countries, the risk of openly walking with... » read more

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