category: Videos

category: IoT, Security & Automotive

Tech Talk: Concurrent Test
By Ed Sperling - 18 Jun, 2014 - Comments: 2

Dave Armstrong, director of business development at Advantest, discusses the usefulness of concurrent test and describes how to maximize the value of this approach. [youtube vid=UFPxTlB2LWQ] » read more

Tech Talk: The New Cost Per Gate Equation
By Ed Sperling - 22 May, 2014 - Comments: 1

eSilicon's Javier DeLaCruz talks with Semiconductor Engineering about new types of interposers, why just shrinking features is doomed, and what progress has been made in building 2.5D chips. [youtube vid=akj8r8nNktM] » read more

Tech Talk: Silicon Photonics
By Ed Sperling - 21 May, 2014 - Comments: 2

Mentor Graphics' John Ferguson explains why light is getting so much attention for inter-chip communications, where it excels, and why it has limitations. This is the first part in a two-part series. [youtube vid=0ydkDmrSrF4] » read more

Tech Talk: Debugging IP
By Ed Sperling - 03 Apr, 2014 - Comments: 0

Just because IP is standard doesn't mean it will function as expected in a complex SoC. Ravindra Aneja, senior technical marketing manager at Atrenta, looks at what needs to be done to make sure everything works together. [youtube vid=wlDabbrF2zU] » read more

Tech Talk: Multipatterning, Take Two
By Brian Bailey - 31 Mar, 2014 - Comments: 0

Mentor Graphics' David Abercrombie continues with his whiteboard talk about coloring with advanced lithography, including what goes wrong and how to fix it. [youtube vid=HCBtvHCcbf4] » read more

Next-Generation Lithography
By Ed Sperling - 04 Mar, 2014 - Comments: 0

Aki Fujimura, CEO of D2S, sat down with Semiconductor Engineering to talk about the challenges of moving to the next process nodes and how that will affect everything from lithography to the write time, size and cost of photomasks. [youtube vid=L96vi-BjhDU] » read more

Tech Talk: Multipatterning
By Brian Bailey - 03 Mar, 2014 - Comments: 2

Mentor Graphics' David Abercrombie shows how multi patterning is supposed to be done, and what sorts of problems can crop up along the way. Now that EUV has hit another hiccup, the semiconductor industry has little choice. [youtube vid=tOs_OMSh4Nk] » read more

Tech Talk: Power, Performance And Area In 2.5D
By Ed Sperling - 12 Feb, 2014 - Comments: 2

The cost will be comparable at first, but the only way to improve power, performance AND area at the same time will be with a different architectural approach. [youtube vid=XAbE7jpjuMA] » read more

Tech Talk: Changes In Verification
By Ed Sperling - 27 Jan, 2014 - Comments: 0

Roger Hughes, director of strategic accounts at Real Intent, talks about what's changing in verification as design complexity increases and where engineers typically make mistakes. [youtube vid=0SE97LvCilo] » read more

Tech Talk: Dealing With The Unknowns
By Ed Sperling - 15 Jan, 2014 - Comments: 0

Rebecca Lipon, senior product marketing manager for verification at Synopsys, discusses the problematic X's and where verification teams typically make mistakes in trying to eliminate the false X's from their designs. Power emerges as the biggest problem. [youtube vid=Iym4ITWJJrs] » read more

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