An open-short normalization (OSN) method eliminates defect-independent reflections to find defect location and type.
Time-domain reflectometry (TDR) that employs electro-optical sampling affords excellent resolution at the femtosecond level and exhibits a comprehensible impulse waveform, thereby allowing quick defect identification in a single trace. However, it remains challenging to identify a defect in a trace of multiple branches; the TDR waveform is complex. Generally, the TDR waveform of a defective unit features defect-dependent reflection (DDR) and defect-independent reflection (DIR). DDR is contributed by a branch with the defect; DIR is contributed by the remaining good branches. The DDR (not the DIR) is required to analyze the defect; however, the DIR tends to overwhelm the waveform, rendering interpretation difficult. In this work, we use an open-short normalization (OSN) method to eliminate the DIR. The resulting DDR immediately identifies the defect location and type. The OSN method was verified using both simulation and measurements.
Click here to read more.
 |
 |
 |
 |
 |
 |
 |
 |
 |
 |
Leave a Reply