Optimizing Testbench Acceleration Performance

Continued integration is no longer the natural way forward for semiconductors. What needs to happen to make it easier?

Improvements in power, performance and area are much more difficult to achieve, but solutions are coming into focus.

Using the Von Neumann architecture for artificial intelligence applications is inefficient. What will replace it?

Shift to cloud model has kept power consumption in check, but that benefit may have run its course.

The next-gen wireless technology is riddled with problems, but that hasn’t slowed the pace of development.

Assessing the reliability of a device requires adding more physical factors into the analysis, many of which are interconnected in complex ways.

Edge compute covers a wide range of applications. Understanding bandwidth and capacity needs is critical.

In-chip monitoring techniques are growing for automotive, industrial, and data center applications.