Power And Signal Line Electro-migration Design And Reliability Validation Challenges For The 28nm Era

Power and signal electromigration for advanced circuits.

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Reliability verification is an important aspect in the design and development of an integrated circuit (IC) to help guarantee its continued functionality over years of production use. One critical area of reliability verification is the electro-migration check analysis to ensure that the wires and vias used to connect the various devices in the chip do not fail from years of continuous use.

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