Rapid Pattern Sequencing And Optimization With STAR Hierarchical System At STMicroelectronics

How to minimize the time required for production tests.


This white paper is the second in a series of two papers on STMicroelectronics’ experience with the Synopsys DesignWare STAR Hierarchical System. This white paper also provides insights on IEEE 1500 based network implementation, execution and analysis. It details the MASIS file’s pattern sequencing which is used for production tests and helps minimize test time. For the thermal sensor example in this paper, designers should note that STAR Hierarchical System minimized loops and decreased the pattern’s duration by 86.5%. Additionally, this white paper explains the hardware structures when using the STAR Hierarchical System. It will also explain how to handle split ring scenarios and later, how to analyze the test results.

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