Mapping, tracking and reacting to changes throughout a chip’s expected lifetime.
How do you track, measure and ensure reliability over the lifetime of a chip, regardless of how or where it is used? Steve Pateras, senior director of marketing for test products at Synopsys, drills down into the impact of hardware-software co-design, over-the-air updates, the expected lifetime of designs, and how the various monitors and sensors are used to track environmental, structural and functional impacts to measure changes and predict their impact.
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