tag: reliability

Why Chips Fail, And What To Do About It
By Ed Sperling - 11 Dec, 2024 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss reliability of chips in the context of safety- and mission-critical systems, as well as increasing utilization due to an explosion in AI data, with Steve Pateras, vice president of marketing and business development at Synopsys; Noam Brousard, vice president of solutions engineering at proteanTecs; Harry Foster, chief verificat... » read more

The Vulnerability of Clock Trees to Asymmetric Aging
By Technical Paper Link - 03 Dec, 2024 - Comments: 0

A new technical paper titled "The Impact of Asymmetric Transistor Aging on Clock Tree Design Considerations" was published by researchers at Israel Institute of Technology and The Hebrew University of Jerusalem. Abstract "Ensuring integrated circuits (ICs) operate reliably throughout their expected service life is more vital than ever, particularly as they become increasingly central to mis... » read more

Extending Chip Lifetime With Safer Voltage Scaling
By Eyal Fayneh - 12 Nov, 2024 - Comments: 0

What if your chips lived 20% longer without compromising performance, and even while reducing power consumption? How would it affect your product’s reliability and cost? What would be the effect on your profitability? With the demand for longer-lasting chips growing across industries, designers and reliability engineers face increasing pressure to ensure their products perform correctly fo... » read more

From Reaction To Prevention In Data Center RAS
By Noam Brousard - 15 Oct, 2024 - Comments: 0

The rise of artificial intelligence (AI), cloud services, and IoT has fueled the rapid expansion of hyperscale data centers. These massive facilities house thousands of servers, all working to support an increasingly digital world. But as the scale of data centers grows, so too does the need for reliable and high-performance semiconductors. Semiconductor failures and inconsistencies can cause s... » read more

New Challenges In IC Reliability
By Ed Sperling - 15 Oct, 2024 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss reliability of chips, how it is changing, and where the new challenges are, with Steve Pateras, vice president of marketing and business development at Synopsys; Noam Brousard, vice president of solutions engineering at proteanTecs; Harry Foster, chief verification scientist at Siemens EDA; and Jerome Toublanc, high-tech soluti... » read more

Signals In The Noise: Tackling High-Frequency IC Test
By Gregory Haley - 15 Oct, 2024 - Comments: 0

The need for high-frequency semiconductor devices is surging, fueled by growing demand for advanced telecommunications, faster sensors, and increasingly autonomous vehicles. The advent of millimeter-wave communication in 5G and 6G is pushing manufacturers to develop chips capable of handling frequencies that were once considered out of reach. However, while these technologies promise faster ... » read more

Real-Time Safety Monitoring
By Ed Sperling - 28 Aug, 2024 - Comments: 0

Various types of semiconductor test will determine whether a chip is free of defects and meets the specification, but understanding how it's behaving in the field under real workloads and harsh ambient conditions may be very different in automotive applications, where vibration, heat, cold can disrupt the normal functioning of a chip over time and reduce its lifespan. Alex Burlak, vice presiden... » read more

Understanding the Importance of Power System Reliability Modelings
By Infineon - 31 Jul, 2024 - Comments: 0

Given the unique challenges that power supplies in high-reliability environments face, Infineon decided to investigate Power System Reliability Modeling (PSRM) and develop innovative solutions to overcome those challenges. This whitepaper will serve as an introduction to this topic and pave the way into this new and innovative field. Read more here. » read more

What’s Missing In Test
By Anne Meixner - 19 Jun, 2024 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss how functional test content is brought up at first silicon, and the balance between ATE and system-level testing, with Klaus-Dieter Hilliges, V93000 platform extension manager at Advantest Europe; Robert Cavagnaro, fellow in the Design Engineering Group at Intel (responsible for manufacturing and test strategy of data center... » read more

Automotive Electronics Reliability Requires In-Field Silicon Monitoring
By Lorin Kennedy - 11 Jun, 2024 - Comments: 1

By Lorin Kennedy and Dan Alexandrescu For everyday consumers, no products require reliability more than automobiles. While consumers may be willing accept their laptops and phones limiting performance or abruptly turning off when systems reach unacceptable temperature levels, that is not the case for the reliability of Advanced Driver-Assistance Systems (ADAS) or other safety critical system... » read more

← Older posts

  • Sponsors

About

Navigation

Connect With Us

Copyright ©2013-2024 SMG   |  Terms of Service  |  Privacy Policy