Who’s Responsible For Transistor Aging Models?


While there are a number of ways to go about reliability and transistor aging analysis, it is all in large part dependent on fabs and foundries to provide the aging models. The situation is also not entirely clear in the semiconductor ecosystem because the classic over-the-wall mentality between design and manufacturing still exists. And unfortunately this wall is bi-directional. Not onl... » read more

Transistor Aging Intensifies At 10/7nm And Below


Transistor aging and reliability are becoming much more troublesome for design teams at 10nm and below. Concepts like ‘infant mortality’ and 'bathtub curves' are not new to semiconductor design, but they largely dropped out of sight as methodologies and EDA tools improved. To get past infant mortality, a burn-in process would be done, particularly for memories. And for reliability, which... » read more

Chip Test Shifts Left


“Shift left” is a term traditionally applied to software testing, meaning to take action earlier in the V-shaped time line of a project. It has recently been touted in electronic design automation and IC design, verification, and test. “Test early and test often” is the classic maxim of software testing. What if that concept could also be implemented in semiconductor testing, to redu... » read more

Focus Shifts To System Quality


For the past decade, many semiconductor industry insiders predicted that software would take over the world and hardware would become commoditized. The pendulum seems to have stopped, and if anything, it is reversing course. Initial predictions were based on several advantages for software. First, software is easier to modify and patch. Second, universities turn out far more software develop... » read more

Autonomous Cars Drive New Software


Autonomous driving and other advanced features will require much more sophisticated software than what is used in vehicles today. To make this all work will require complex algorithms as well as co-designed hardware, which can make real-time decisions to avoid accidents and adjust to changing road conditions. Automobiles already take advantage of sophisticated software executed by a variety ... » read more

Verification And The IoT


Semiconductor Engineering sat down to discuss what impact the IoT will have on the design cycle, with Christopher Lawless, director of external customer acceleration in [getentity id="22846" e_name="Intel"]'s Software Services Group; David Lacey, design and verification technologist at Hewlett Packard Enterprise; Jim Hogan, managing partner at Vista Ventures; Frank Schirrmeister, senior group d... » read more

When Will It Be Done?


Design teams have done remarkably well in getting chips out the door on time, despite growing complexity at each new node and an increase in the number of features and IP blocks that need to be integrated into designs. There has been plenty of grumbling, along with dire warnings about the future of Moore's Law and the impact of industry consolidation. The reality, though, is that the volume ... » read more

Test More Complex For Cars, IoT


With increasing focus on safety-critical semiconductors—driven by ADAS, IoT, and security—functional safety concerns are going through the roof. Engineering teams are scrambling to determine how to conduct better in-field or online testing because test no longer can be an afterthought. This has been a common theme across the automotive ecosystem for the past few years, and as the automot... » read more

What Can Go Wrong In Automotive


Semiconductor Engineering sat down to discuss automotive engineering with Jinesh Jain, supervisor for advanced architectures in Ford’s Research and Innovation Center in Palo Alto; Raed Shatara, market development for automotive infotainment at [getentity id="22331" comment="STMicroelectronics"]; Joe Hupcey, verification product technologist at [getentity id="22017" e_name="Mentor Graphics"]; ... » read more

BEOL Issues At 10nm And 7nm


Semiconductor Engineering sat down to discuss problems with the back end of line at leading-edge nodes with Craig Child, senior manager and deputy director for [getentity id="22819" e_name="GlobalFoundries'"] advanced technology development integration unit; Paul Besser, senior technology director at [getentity id="22820" comment="Lam Research"]; David Fried, CTO at [getentity id="22210" e_name... » read more

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