Making AI More Dependable


Ira Leventhal, vice president of Advantest’s new concept product initiative, looks at why AI has taken so long to get going, what role it will play in improving the reliability of all chips, and how to use AI to improve the reliability of AI chips themselves. » read more

Automotive System Design


Burkhard Huhnke, vice president of automotive at Synopsys, looks at how to build and update chips in increasingly sophisticated vehicles, where the problem spots are, and what comes next. » read more

Week In Review: Design, Low Power


ANSYS acquired the assets of DfR Solutions, a developer of automated design reliability analysis software. Founded in 2004 and based in Maryland, DfR's tool translates ECAD and MCAE data into 3D finite element models, automates thermal derating and performs thermal and mechanical analysis of electronics earlier in the design cycle. "ANSYS brings industry-leading electronic simulation capabiliti... » read more

Road Not Fully Constructed


There is a growing consensus in the semiconductor industry that SAE Level 3 and Level 4 autonomy will be full of unexpected hazards. At a number of recent conferences in Silicon Valley, experts from all parts of the semiconductor industry have voiced concern about those middle steps between assisted driving and full autonomy. This isn't the public position taken by carmakers and Tier 1s.... » read more

Addressing IC Reliability Issues Using Eldo


Advanced, short-geometry CMOS processes are subject to aging that causes major reliability issues that degrade the performance of integrated circuits (ICs) over time. Degradation effects causing aging are hot carrier injection (HCI) and negative bias temperature instability (NBTI), in addition to positive bias temperature instability (PBTI) and time-dependent dielectric breakdown (TDDB). Below ... » read more

Redefining Expectations For Test


New and rapidly expanding applications, such as artificial intelligence and automotive, are increasing in design size and complexity. These evolving market segments require unprecedented levels of quality and long-term reliability, which has created a fundamental shift in both the importance and need for integration of advanced semiconductor test. Synopsys unveiled a new family of test products... » read more

The Growing Challenge Of Thermal Guard-Banding


Guard-banding for heat is becoming more difficult as chips are used across a variety of new and existing applications, forcing chipmakers to architect their way through increasingly complex interactions. Chips are designed to operate at certain temperatures, and it is common practice to develop designs with some margin to ensure correct functionality and performance throughout the operat... » read more

Chip Design For The Age Of New Mobility


In the new age of mobility, vehicles are valued more and more for their electronic features instead of mechanical specifications. As a result, companies that are able to own and optimize the design of these critical electronics will capture more of the available profit. This is bringing traditional automotive manufacturers into the electronics business, while simultaneously attracting tech comp... » read more

How To Build An Automotive Chip


The introduction of advanced electronics into automotive design is causing massive disruption in a supply chain that, until very recently, hummed along like a finely tuned sports car. The rapid push toward autonomous driving has changed everything. This year, Level 3 autonomy will begin hitting the streets, and behind the scenes, work is underway to design SoCs for Level 4. But how these chi... » read more

Crisis In Data


The push toward data-driven design, debug, manufacturing and reliability holds huge promise, but the big risk is none of this will happen in an organized fashion and everyone will be frustrated. One of the clear messages coming out of DVCon this week is that standards need to be established for data. Even within large chipmakers and systems companies, the data they extract from tools is not ... » read more

← Older posts Newer posts →