tag: reliability

Electromigration Performance Of Fine-Line Cu Redistribution Layer (RDL) For HDFO Packaging
By JiHye Kwon - 18 Jan, 2024 - Comments: 0

The downsizing trend of devices gives rise to continuous demands of increasing input/output (I/O) and circuit density, and these needs encourage the development of a High-Density Fan-Out (HDFO) package with fine copper (Cu) redistribution layer (RDL). For mobile and networking application with high performance, HDFO is an emerging solution because aggressive design rules can be applied to HDFO ... » read more

In-Product BTI Aging Sensor For Reliability Screening And Early Detection Of Material At Risk
By PDF Solutions - 09 Jan, 2024 - Comments: 0

We have developed a new reliability monitoring suite, within a proprietary IP block that we call a CV Core, with aging sensors embedded in the product layout and testable through the product I / O interface. We illustrate the application of the sensor suite with an example of the PMOS NBTI monitor, testable at the wafer level during product electrical wafer sort (EWS), as well after packaging a... » read more

Using Deep Data For Improved Reliability Testing
By Ed Sperling - 08 Jan, 2024 - Comments: 0

Reliability testing always has been a challenge for semiconductor companies, but it’s becoming much more difficult as devices continue to shrink, as they’re integrated together in advanced packages, and as they’re utilized under different conditions with life expectancy that varies by application and use case. Nir Sever, senior director of business development at proteanTecs, and Luca Mor... » read more

IoT Building Block: Touch Interface HMI
By Jason Chien - 08 Jan, 2024 - Comments: 0

Many IoT devices have started to include touch screen interfaces as part of their UI to make the devices more intuitive and easier to use. A great interface can make customers really love and want to use your IoT product, but a poor HMI interface makes the device unusable damaging the brand value. Given this impact a touch interface can have on your IoT device, it made me wonder what are the... » read more

Testing ICs Faster, Sooner, And Better
By Laura Peters - 12 Dec, 2023 - Comments: 0

The infrastructure around semiconductor testing is changing as companies build systems capable of managing big data, utilizing real-time data streams and analysis to reduce escape rates on complex IC devices. At the heart of these tooling and operational changes is the need to solve infant mortality issues faster, and to catch latent failures before they become reliability problems in the fi... » read more

Mission Profile Analytics For The Automotive Industry
By Dan Alexandrescu - 12 Dec, 2023 - Comments: 0

The automotive industry is undergoing a major transformation with the rise of electrification, connectivity, and autonomous driving capabilities fueling the need for a greater number of more advanced semiconductors. The associated regulatory expectations are also creating challenging safety and reliability requirements for automotive-grade silicon that need to be understood and managed over a w... » read more

What Can Go Wrong In Heterogeneous Integration
By Ed Sperling - 15 Nov, 2023 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss heterogeneous integration with Dick Otte, president and CEO of Promex Industries; Mike Kelly, vice president of chiplets/FCBGA integration at Amkor Technology; Shekhar Kapoor, senior director of product management at Synopsys; John Park, product management group director in Cadence's Custom IC & PCB Group; and Tony Mastroia... » read more

Damage Detection For Reliable Microelectronics
By Jens Michael Warmuth - 09 Nov, 2023 - Comments: 0

Over the past few years, the reliability and safety of electronic systems have become increasingly more important. Ongoing digitalization has made these systems an integral part of many items of daily use. This means that failures are becoming more and more critical as they can cause considerable disruption – even when they occur in consumer electronics. Today, electronics are also indispensa... » read more

New Insights Into IC Process Defectivity
By Laura Peters - 07 Nov, 2023 - Comments: 1

Finding critical defects in manufacturing is becoming more difficult due to tighter design margins, new processes, and shorter process windows. Process marginality and parametric outliers used to be problematic at each new node, but now they are persistent problems at several nodes and in advanced packaging, where there may be a mix of different technologies. In addition, there are more proc... » read more

Rebalancing Test And Yield In IC Manufacturing
By Gregory Haley - 07 Nov, 2023 - Comments: 0

Balancing yield and test is essential to semiconductor manufacturing, but it's becoming harder to determine how much weight to give one versus the other as chips become more specialized for different applications. Yield focuses on maximizing the number of functional chips from a production batch, while test aims to ensure that each chip meets rigorous quality and performance standards. And w... » read more

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